Peter S. Schultz

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Gilbert, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Sensor single track trim using stationary hardware and fields
- Patent number 9,213,071
- Issue date Dec 15, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Peter S. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Testing an electrical connection of a device cap
- Patent number 8,969,102
- Issue date Mar 3, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Peter S. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Offset error automatic calibration integrated circuit
- Patent number 8,689,604
- Issue date Apr 8, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Peter S. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device with enhanced resistance to stiction
- Patent number 8,555,720
- Issue date Oct 15, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Peter S. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Offset error automatic calibration integrated circuit
- Patent number 8,321,170
- Issue date Nov 27, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Peter S. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Caddie-corner single proof mass XYZ MEMS transducer
- Patent number 7,793,542
- Issue date Sep 14, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Peter S. Schultz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING AN ELECTRICAL CONNECTION OF A DEVICE CAP
- Publication number 20140329344
- Publication date Nov 6, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Peter S. Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR SINGLE TRACK TRIM USING STATIONARY HARDWARE AND FIELDS
- Publication number 20140122013
- Publication date May 1, 2014
- PETER S. SCHULTZ
- G01 - MEASURING TESTING
Information Patent Application
OFFSET ERROR AUTOMATIC CALIBRATION INTEGRATED CIRCUIT
- Publication number 20130061649
- Publication date Mar 14, 2013
- FREESCALE SEMICONDUCTOR, INC.
- PETER S. SCHULTZ
- G01 - MEASURING TESTING
Information Patent Application
MEMS Device With Enhanced Resistance to Stiction
- Publication number 20120216616
- Publication date Aug 30, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Peter S. Schultz
- G01 - MEASURING TESTING
Information Patent Application
OFFSET ERROR AUTOMATIC CALIBRATION INTEGRATED CIRCUIT
- Publication number 20110208460
- Publication date Aug 25, 2011
- Peter S. Schultz
- G01 - MEASURING TESTING