Peter Speckbacher

Person

Kirchweidach, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Grating structure for a diffractive optic
- Patent number 11,480,717
- Issue date Oct 25, 2022
- Dr. Johannes Heidenhain GmbH
- Josef Weidmann
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Scanning reticle including a grating formed in a substrate for an o...
- Patent number 10,914,615
- Issue date Feb 9, 2021
- Dr. Johannes Heidenhain GmbH
- Stefan Funk
- G01 - MEASURING TESTING
Information Patent Grant
Method for machining a scale
- Patent number 10,222,192
- Issue date Mar 5, 2019
- Dr. Johannes Heidenhain GmbH
- Moritz Schwabe
- B24 - GRINDING POLISHING
Information Patent Grant
Optical position-measuring device having grating fields with differ...
- Patent number 10,119,802
- Issue date Nov 6, 2018
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Optical layer system
- Patent number 10,094,961
- Issue date Oct 9, 2018
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G02 - OPTICS
Information Patent Grant
Scale and position-measuring device having such a scale
- Patent number 10,018,485
- Issue date Jul 10, 2018
- Dr. Johannes Heidenhain GmbH
- Stefan Funk
- G02 - OPTICS
Information Patent Grant
Position-measuring device
- Patent number 9,677,874
- Issue date Jun 13, 2017
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Measuring graduation and photoelectric position measuring device ha...
- Patent number 9,453,744
- Issue date Sep 27, 2016
- Dr. Johannes Heidenhain GmbH
- Josef Weidmann
- G01 - MEASURING TESTING
Information Patent Grant
Assembly comprising a measuring scale attached to a substrate and m...
- Patent number 8,650,769
- Issue date Feb 18, 2014
- Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement with a scale fastened on a support
- Patent number 8,234,793
- Issue date Aug 7, 2012
- Dr. Johannes Heidenhain GmbH
- Josef Weidmann
- G01 - MEASURING TESTING
Information Patent Grant
Scanning head for optical position-measuring systems
- Patent number 7,719,075
- Issue date May 18, 2010
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Method for attaching a scale to a carrier, a scale, and carrier hav...
- Patent number 7,707,739
- Issue date May 4, 2010
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Method for mounting a scale on a support and arrangement with a sup...
- Patent number 7,549,234
- Issue date Jun 23, 2009
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a scale, a scale manufactured according to...
- Patent number 7,312,878
- Issue date Dec 25, 2007
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G02 - OPTICS
Information Patent Grant
Optoelectronic transceiver
- Patent number 7,058,309
- Issue date Jun 6, 2006
- Dr. Johannes Heidenhain GmbH
- Christian Eisenberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflectometer and method for manufacturing a reflectometer
- Patent number 6,961,174
- Issue date Nov 1, 2005
- Dr. Johannes Heidenhain GmbH
- Josef Weidmann
- G01 - MEASURING TESTING
Information Patent Grant
Material measure and position measuring device comprising such a ma...
- Patent number 6,844,558
- Issue date Jan 18, 2005
- Dr. Johannes Heidenhain GmbH
- Josef Weidmann
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a self-supporting electron-optical transparent...
- Patent number 6,800,404
- Issue date Oct 5, 2004
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated optoelectronic thin-film sensor and method of producing...
- Patent number 6,621,104
- Issue date Sep 16, 2003
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic component with a space kept free from underfiller
- Patent number 6,605,828
- Issue date Aug 12, 2003
- Dr. Johanns Hudenheim GmbH
- Günter Schwarzrock
- G01 - MEASURING TESTING
Information Patent Grant
Optical detector for measuring relative displacement of an object o...
- Patent number 6,486,467
- Issue date Nov 26, 2002
- Dr. Johannes Heiden Hain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric position measuring device
- Patent number 6,445,456
- Issue date Sep 3, 2002
- Dr. Johannas Heidenhain GmbH
- Peter Speckbacher
- G02 - OPTICS
Information Patent Grant
Radiation-sensitive detector element and method for producing it
- Patent number 5,852,322
- Issue date Dec 22, 1998
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase grating and method of producing phase grating
- Patent number 5,786,931
- Issue date Jul 28, 1998
- Johannes Heidenhain GmbH
- Peter Speckbacher
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
PHOTOCATALYTIC LAYER ARRANGEMENT AND METHOD FOR PRODUCING SUCH A LA...
- Publication number 20240278213
- Publication date Aug 22, 2024
- Dr. Johannes Heidenhain Gmbh
- Peter SPECKBACHER
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
STRUCTURED LAYER ARRANGEMENT AND METHOD FOR PRODUCING A LAYER ARRAN...
- Publication number 20230381766
- Publication date Nov 30, 2023
- Dr. Johannes Heidenhain Gmbh
- Peter SPECKBACHER
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
GRATING STRUCTURE FOR A DIFFRACTIVE OPTIC
- Publication number 20200110204
- Publication date Apr 9, 2020
- Dr. Johannes Heidenhain Gmbh
- Josef Weidmann
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
SCANNING RETICLE FOR AN OPTICAL POSITION MEASURING DEVICE
- Publication number 20190041243
- Publication date Feb 7, 2019
- Dr. Johannes Heidenhain Gmbh
- Stefan FUNK
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MACHINING A SCALE
- Publication number 20170211920
- Publication date Jul 27, 2017
- Dr. Johannes Heidenhain Gmbh
- Moritz Schwabe
- G01 - MEASURING TESTING
Information Patent Application
SCALE AND POSITION-MEASURING DEVICE HAVING SUCH A SCALE
- Publication number 20170211951
- Publication date Jul 27, 2017
- Dr. Johannes Heidenhain Gmbh
- Stefan Funk
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL POSITION-MEASURING DEVICE
- Publication number 20170211923
- Publication date Jul 27, 2017
- Dr. Johannes Heidenhain Gmbh
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL LAYER SYSTEM
- Publication number 20170090079
- Publication date Mar 30, 2017
- Dr. Johannes Heidenhain Gmbh
- Peter Speckbacher
- G02 - OPTICS
Information Patent Application
POSITION-MEASURING DEVICE
- Publication number 20160216103
- Publication date Jul 28, 2016
- Dr. Johannes Heidenhain Gmbh
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Application
MEASURING GRADUATION AND PHOTOELECTRIC POSITION MEASURING DEVICE HA...
- Publication number 20150098094
- Publication date Apr 9, 2015
- Dr. Johannes Heidenhain Gmbh
- Josef Weidmann
- G01 - MEASURING TESTING
Information Patent Application
Assembly Comprising a Measuring Scale Attached to a Substrate and M...
- Publication number 20120023769
- Publication date Feb 2, 2012
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Application
Arrangement with a scale fastened on a support
- Publication number 20110119945
- Publication date May 26, 2011
- Dr. Johannes Heidenhain GmbH
- Josef Weidmann
- G01 - MEASURING TESTING
Information Patent Application
Scanning Head for Optical Position-Measuring Systems
- Publication number 20070278486
- Publication date Dec 6, 2007
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Application
Method for mounting a scale on a support and arrangement with a sup...
- Publication number 20070227027
- Publication date Oct 4, 2007
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Method for attaching a scale to a carrier, a scale, and carrier hav...
- Publication number 20070137059
- Publication date Jun 21, 2007
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Method for producing a scale scale produced according to said metho...
- Publication number 20050052743
- Publication date Mar 10, 2005
- Peter Speckbacher
- G02 - OPTICS
Information Patent Application
Method for producing a self-supporting electron-optical transparent...
- Publication number 20030036022
- Publication date Feb 20, 2003
- Peter Speckbacher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTOELECTRIC POSITION MEASURING DEVICE
- Publication number 20010046055
- Publication date Nov 29, 2001
- PETER SPECKBACHER
- G01 - MEASURING TESTING

Peter Speckbacher

Person

Patents Grantslast 30 patents

Grating structure for a diffractive optic

Scanning reticle including a grating formed in a substrate for an o...

Method for machining a scale

Optical position-measuring device having grating fields with differ...

Optical layer system

Scale and position-measuring device having such a scale

Position-measuring device

Measuring graduation and photoelectric position measuring device ha...

Assembly comprising a measuring scale attached to a substrate and m...

Arrangement with a scale fastened on a support

Scanning head for optical position-measuring systems

Method for attaching a scale to a carrier, a scale, and carrier hav...

Method for mounting a scale on a support and arrangement with a sup...

Method for manufacturing a scale, a scale manufactured according to...

Optoelectronic transceiver

Reflectometer and method for manufacturing a reflectometer

Material measure and position measuring device comprising such a ma...

Method for producing a self-supporting electron-optical transparent...

Integrated optoelectronic thin-film sensor and method of producing...

Optoelectronic component with a space kept free from underfiller

Optical detector for measuring relative displacement of an object o...

Photoelectric position measuring device

Radiation-sensitive detector element and method for producing it

Phase grating and method of producing phase grating

Patents Applicationslast 30 patents

PHOTOCATALYTIC LAYER ARRANGEMENT AND METHOD FOR PRODUCING SUCH A LA...

STRUCTURED LAYER ARRANGEMENT AND METHOD FOR PRODUCING A LAYER ARRAN...

GRATING STRUCTURE FOR A DIFFRACTIVE OPTIC

SCANNING RETICLE FOR AN OPTICAL POSITION MEASURING DEVICE

METHOD FOR MACHINING A SCALE

SCALE AND POSITION-MEASURING DEVICE HAVING SUCH A SCALE

OPTICAL POSITION-MEASURING DEVICE

OPTICAL LAYER SYSTEM

POSITION-MEASURING DEVICE

MEASURING GRADUATION AND PHOTOELECTRIC POSITION MEASURING DEVICE HA...

Assembly Comprising a Measuring Scale Attached to a Substrate and M...

Arrangement with a scale fastened on a support

Scanning Head for Optical Position-Measuring Systems

Method for mounting a scale on a support and arrangement with a sup...

Method for attaching a scale to a carrier, a scale, and carrier hav...

Method for producing a scale scale produced according to said metho...

Method for producing a self-supporting electron-optical transparent...

PHOTOELECTRIC POSITION MEASURING DEVICE