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Peter Spizig
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Niederstotzingen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method and device for imaging a specimen surface
Patent number
11,385,180
Issue date
Jul 12, 2022
Witec Wissenschaftliche Instrumente und Technologie GmbH
Peter Spizig
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for imaging a specimen surface
Patent number
10,876,895
Issue date
Dec 29, 2020
Witec Wissenschaftliche Instrumente und Technologie GmbH
Peter Spizig
G02 - OPTICS
Information
Patent Grant
Device for imaging a sample surface
Patent number
10,649,189
Issue date
May 12, 2020
Witec Wissenschaftliche Instrumente und Technologie GmbH
Olaf Hollricher
G02 - OPTICS
Information
Patent Grant
Apparatus for imaging a sample surface
Patent number
9,891,418
Issue date
Feb 13, 2018
Witec Wissenschaftliche Instrumente und Technologie GmbH
Peter Spizig
G02 - OPTICS
Information
Patent Grant
Scanning probe in pulsed-force mode, digital and in real time
Patent number
8,286,261
Issue date
Oct 9, 2012
Witec Wissenchaftliche Instrumente und Technologie GmbH
Peter Spizig
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe in pulsed-force mode, digital and in real time
Patent number
7,877,816
Issue date
Jan 25, 2011
Witec Wissenschaftliche Instrumente und Technologie GmbH
Peter Spizig
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe with digitized pulsed-force mode operation and real-...
Patent number
7,129,486
Issue date
Oct 31, 2006
Witec Wissenschaftliche Instrumente und Technologie GmbH
Peter Spizig
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND DEVICE FOR IMAGING A SPECIMEN SURFACE
Publication number
20210148823
Publication date
May 20, 2021
Witec Wissenschaftliche Instrumente und Technologie GmbH
Peter SPIZIG
G01 - MEASURING TESTING
Information
Patent Application
Method and Device for Imaging a Specimen Surface
Publication number
20200025615
Publication date
Jan 23, 2020
Witec Wissenschaftliche Instrumente und Technologie GmbH
Peter SPIZIG
G01 - MEASURING TESTING
Information
Patent Application
Device For Imaging A Sample Surface
Publication number
20180143415
Publication date
May 24, 2018
Witec Wissenschaftliche Instrumente und Technologie GmbH
Olaf Hollricher
G02 - OPTICS
Information
Patent Application
Apparatus for imaging a sample surface
Publication number
20120314206
Publication date
Dec 13, 2012
Peter Spizig
G02 - OPTICS
Information
Patent Application
Scanning probe in pulsed-force mode, digital and in real time
Publication number
20100313311
Publication date
Dec 9, 2010
Peter Spizig
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe in pulsed-force mode, digital and in real time
Publication number
20070114406
Publication date
May 24, 2007
Witec Wissenschaftliche Instrumente und Technologie GmbH
Peter Spizig
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe with digitised pulsed-force mode operation and real-...
Publication number
20040084618
Publication date
May 6, 2004
Peter Spizig
G01 - MEASURING TESTING