Peter STATHAM

Person

Oxon, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Navigation for electron microscopy
- Patent number 11,688,582
- Issue date Jun 27, 2023
- Oxford Instruments Nanotechnology Tools Limited
- Anthony Hyde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for electron diffraction analysis
- Patent number 11,195,692
- Issue date Dec 7, 2021
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material identification using multiple images
- Patent number 10,354,414
- Issue date Jul 16, 2019
- Oxford Instruments Nanotehnology Tools Limited
- Peter John Statham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray analysis in air
- Patent number 10,354,834
- Issue date Jul 16, 2019
- Oxford Instruments Nanotechnology Tools Limited
- Peter J. Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring the mass thickness of a target sample for elec...
- Patent number 10,054,557
- Issue date Aug 21, 2018
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing a particle spectrum
- Patent number 10,018,737
- Issue date Jul 10, 2018
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- G01 - MEASURING TESTING
Information Patent Grant
Method of reducing the thickness of a target sample
- Patent number 9,704,689
- Issue date Jul 11, 2017
- Oxford Instruments Nanotechnology Tools Limited
- Christian Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analysis in air
- Patent number 9,704,688
- Issue date Jul 11, 2017
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for performing microdiffraction analysis
- Patent number 8,890,065
- Issue date Nov 18, 2014
- Oxford Instruments Nanotechnology Tools Limited
- Peter J. Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle analyser and method using electrostatic filter gri...
- Patent number 8,421,027
- Issue date Apr 16, 2013
- Oxford Instruments Nanotechnology Tools Limited
- Ian Richard Barkshire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining the feasibility of a proposed structure analy...
- Patent number 8,346,521
- Issue date Jan 1, 2013
- Oxford Instruments Nanotechnology Tools Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Grant
Method for quantitative analysis of a material
- Patent number 8,222,598
- Issue date Jul 17, 2012
- Oxford Instruments Analytical Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Grant
Method of calculating the structure of an inhomogeneous sample
- Patent number 8,065,094
- Issue date Nov 22, 2011
- Oxford Instruments Nonotechnology Tools Unlimited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for material identification
- Patent number 7,595,489
- Issue date Sep 29, 2009
- Oxford Instruments Analytical Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analysing a dataset of spectra
- Patent number 7,533,000
- Issue date May 12, 2009
- Oxford Instruments Analytical Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Grant
Visual color mapping X-ray analysis apparatus
- Patent number 5,357,110
- Issue date Oct 18, 1994
- Link Analytical Limited
- Peter J. Statham
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMPROVED NAVIGATION FOR ELECTRON MICROSCOPY
- Publication number 20240339293
- Publication date Oct 10, 2024
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PREPARATION METHOD AND APPARATUS
- Publication number 20230273136
- Publication date Aug 31, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- John Lindsay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
- Publication number 20230258587
- Publication date Aug 17, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Simon BURGESS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS
- Publication number 20230175991
- Publication date Jun 8, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Robert MASTERS
- G01 - MEASURING TESTING
Information Patent Application
NAVIGATION FOR ELECTRON MICROSCOPY
- Publication number 20210151287
- Publication date May 20, 2021
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Anthony Hyde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED SYSTEM FOR ELECTRON DIFFRACTION ANALYSIS
- Publication number 20200273663
- Publication date Aug 27, 2020
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD FOR MEASURING THE MASS THICKNESS OF A TARGET SAMPLE FOR EL...
- Publication number 20170269011
- Publication date Sep 21, 2017
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter Statham
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS IN AIR
- Publication number 20170271125
- Publication date Sep 21, 2017
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter J. STATHAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY ANALYSIS IN AIR
- Publication number 20160233051
- Publication date Aug 11, 2016
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter STATHAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROCESSING A PARTICLE SPECTRUM
- Publication number 20160116615
- Publication date Apr 28, 2016
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter STATHAM
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF REDUCING THE THICKNESS OF A TARGET SAMPLE
- Publication number 20160093468
- Publication date Mar 31, 2016
- OXFORD INSTRUMENTS NANOTCHNOLOGY TOOLS LIMITED
- Christian LANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR PERFORMING MICRODIFFRACTION ANALYSIS
- Publication number 20140252226
- Publication date Sep 11, 2014
- Peter J. Statham
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL IDENTIFICATION USING MULTIPLE IMAGES
- Publication number 20140035943
- Publication date Feb 6, 2014
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter J. Statham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR QUANTITATIVE ANALYSIS OF A MATERIAL
- Publication number 20110129066
- Publication date Jun 2, 2011
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE ANALYSER AND METHOD
- Publication number 20100163725
- Publication date Jul 1, 2010
- Ian Richard Barkshire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CALCULATING THE STRUCTURE OF AN INHOMOGENEOUS SAMPLE
- Publication number 20100030488
- Publication date Feb 4, 2010
- Oxford Instruments Analytical Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING THE FEASIBILITY OF A PROPOSED STRUCTURE ANALY...
- Publication number 20100017172
- Publication date Jan 21, 2010
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ANALYSING A DATASET OF SPECTRA
- Publication number 20080027676
- Publication date Jan 31, 2008
- Oxford Instruments Analytical Limited
- Peter John Statham
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Material Identification
- Publication number 20060291619
- Publication date Dec 28, 2006
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- Peter John Statham
- G01 - MEASURING TESTING

Peter STATHAM

Person

Patents Grantslast 30 patents

Navigation for electron microscopy

System for electron diffraction analysis

Material identification using multiple images

X-ray analysis in air

Method for measuring the mass thickness of a target sample for elec...

Method of processing a particle spectrum

Method of reducing the thickness of a target sample

X-ray analysis in air

Apparatus and method for performing microdiffraction analysis

Charged particle analyser and method using electrostatic filter gri...

Method of determining the feasibility of a proposed structure analy...

Method for quantitative analysis of a material

Method of calculating the structure of an inhomogeneous sample

Method and apparatus for material identification

Method and apparatus for analysing a dataset of spectra

Visual color mapping X-ray analysis apparatus

Patents Applicationslast 30 patents

IMPROVED NAVIGATION FOR ELECTRON MICROSCOPY

SAMPLE PREPARATION METHOD AND APPARATUS

MATERIAL ANALYSIS WITH MULTIPLE DETECTORS

IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS

NAVIGATION FOR ELECTRON MICROSCOPY

IMPROVED SYSTEM FOR ELECTRON DIFFRACTION ANALYSIS

A METHOD FOR MEASURING THE MASS THICKNESS OF A TARGET SAMPLE FOR EL...

X-RAY ANALYSIS IN AIR

X-RAY ANALYSIS IN AIR

METHOD OF PROCESSING A PARTICLE SPECTRUM

METHOD OF REDUCING THE THICKNESS OF A TARGET SAMPLE

APPARATUS AND METHOD FOR PERFORMING MICRODIFFRACTION ANALYSIS

MATERIAL IDENTIFICATION USING MULTIPLE IMAGES

METHOD FOR QUANTITATIVE ANALYSIS OF A MATERIAL

CHARGED PARTICLE ANALYSER AND METHOD

METHOD OF CALCULATING THE STRUCTURE OF AN INHOMOGENEOUS SAMPLE

METHOD OF DETERMINING THE FEASIBILITY OF A PROPOSED STRUCTURE ANALY...

METHOD AND APPARATUS FOR ANALYSING A DATASET OF SPECTRA

Method and Apparatus for Material Identification