Peter T. Di Stefano

Person

San Mateo, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Connectors for interconnecting microelectronic circuits
- Patent number 11,431,115
- Issue date Aug 30, 2022
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transport apparatus for moving carriers of test parts
- Patent number 9,841,461
- Issue date Dec 12, 2017
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- G01 - MEASURING TESTING
Information Patent Grant
Transport apparatus for moving carriers of test parts
- Patent number 8,970,244
- Issue date Mar 3, 2015
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- G01 - MEASURING TESTING
Information Patent Grant
Carrier for holding microelectronic devices
- Patent number 8,720,875
- Issue date May 13, 2014
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for aligning and/or leveling a test head
- Patent number 8,348,252
- Issue date Jan 8, 2013
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for setting and controlling temperature
- Patent number 8,025,097
- Issue date Sep 27, 2011
- Centipede Systems, Inc.
- Peter T. Di Stefano
- G05 - CONTROLLING REGULATING
Information Patent Grant
Probe head apparatus for testing semiconductors
- Patent number 8,004,296
- Issue date Aug 23, 2011
- Centipede Systems, Inc.
- Peter T. Di Stefano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus including a fluid coupler interfaced to a test head
- Patent number 7,870,800
- Issue date Jan 18, 2011
- Centipede Systems, Inc.
- Peter T. Di Stefano
- G01 - MEASURING TESTING
Information Patent Grant
Cooling apparatus for microelectronic devices
- Patent number 7,849,914
- Issue date Dec 14, 2010
- Clockspeed, Inc.
- Peter T. Di Stefano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compliant thermal contactor
- Patent number 7,834,447
- Issue date Nov 16, 2010
- Centipede Systems, Inc.
- Konstantine N. Karavakis
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for aligning and/or leveling a test head
- Patent number 7,764,076
- Issue date Jul 27, 2010
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- G01 - MEASURING TESTING
Information Patent Grant
Compliant thermal contactor
- Patent number 7,719,816
- Issue date May 18, 2010
- Centipede Systems, Inc.
- Konstantine N. Karavakis
- G01 - MEASURING TESTING
Information Patent Grant
Mounting apparatus
- Patent number 7,562,617
- Issue date Jul 21, 2009
- Centipede Systems, Inc.
- Peter T. Di Stefano
- G01 - MEASURING TESTING
Information Patent Grant
Self-cleaning socket for microelectronic devices
- Patent number 7,491,069
- Issue date Feb 17, 2009
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Connectors for Interconnecting Microelectronic Circuits
- Publication number 20210257758
- Publication date Aug 19, 2021
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transport Apparatus for Moving Carriers of Test Parts
- Publication number 20150177318
- Publication date Jun 25, 2015
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- G01 - MEASURING TESTING
Information Patent Application
Transport Apparatus for Moving Carriers of Test Parts
- Publication number 20110074458
- Publication date Mar 31, 2011
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- G01 - MEASURING TESTING
Information Patent Application
Carrier for Holding Microelectronic Devices
- Publication number 20110074080
- Publication date Mar 31, 2011
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Aligning and/or Leveling a Test Head
- Publication number 20100243071
- Publication date Sep 30, 2010
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- G01 - MEASURING TESTING
Information Patent Application
Probe Head Apparatus for Testing Semiconductors
- Publication number 20100045322
- Publication date Feb 25, 2010
- Centipede Systems, Inc.
- Peter T. Di Stefano
- G01 - MEASURING TESTING
Information Patent Application
Compliant thermal contactor
- Publication number 20080290503
- Publication date Nov 27, 2008
- Centipede Systems, Inc.
- Konstantine N. Karavakis
- G01 - MEASURING TESTING
Information Patent Application
Compliant thermal contactor
- Publication number 20080290504
- Publication date Nov 27, 2008
- Centipede Systems, Inc.
- Konstantine N. Karavakis
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for aligning and/or leveling a test head
- Publication number 20080196474
- Publication date Aug 21, 2008
- Centipede Systems, Inc.
- Thomas H. Di Stefano
- G01 - MEASURING TESTING
Information Patent Application
Apparatus including a fluid coupler interfaced to a test head
- Publication number 20070288823
- Publication date Dec 13, 2007
- Centipede Systems, Inc.
- Peter T. Di Stefano
- G01 - MEASURING TESTING
Information Patent Application
Mounting apparatus
- Publication number 20070273398
- Publication date Nov 29, 2007
- Centipede Systems, Inc.
- Peter T. Di Stefano
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for setting and controlling temperature
- Publication number 20070267188
- Publication date Nov 22, 2007
- Centipede Systems, Inc.
- Peter T. Di Stefano
- G05 - CONTROLLING REGULATING
Information Patent Application
Cooling apparatus for microelectronic devices
- Publication number 20070256810
- Publication date Nov 8, 2007
- Clockspeed, Inc.
- Peter T. Di Stefano
- H01 - BASIC ELECTRIC ELEMENTS

Peter T. Di Stefano

Person

Patents Grantslast 30 patents

Connectors for interconnecting microelectronic circuits

Transport apparatus for moving carriers of test parts

Transport apparatus for moving carriers of test parts

Carrier for holding microelectronic devices

Method and apparatus for aligning and/or leveling a test head

Method and apparatus for setting and controlling temperature

Probe head apparatus for testing semiconductors

Apparatus including a fluid coupler interfaced to a test head

Cooling apparatus for microelectronic devices

Compliant thermal contactor

Method and apparatus for aligning and/or leveling a test head

Compliant thermal contactor

Mounting apparatus

Self-cleaning socket for microelectronic devices

Patents Applicationslast 30 patents

Connectors for Interconnecting Microelectronic Circuits

Transport Apparatus for Moving Carriers of Test Parts

Transport Apparatus for Moving Carriers of Test Parts

Carrier for Holding Microelectronic Devices

Method and Apparatus for Aligning and/or Leveling a Test Head

Probe Head Apparatus for Testing Semiconductors

Compliant thermal contactor

Compliant thermal contactor

Method and apparatus for aligning and/or leveling a test head

Apparatus including a fluid coupler interfaced to a test head

Mounting apparatus

Method and apparatus for setting and controlling temperature

Cooling apparatus for microelectronic devices