Peter T. Jones

Person

Scottsdale, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Controlled pulse generation methods and apparatuses for evaluating...
- Patent number 10,393,618
- Issue date Aug 27, 2019
- NXP USA, INC.
- Peter T. Jones
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Magnetometer test arrangement and method
- Patent number 9,612,309
- Issue date Apr 4, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Peter T. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic pre-conditioning of magnetic sensors
- Patent number 9,543,067
- Issue date Jan 10, 2017
- NXP USA, INC.
- Carlos M. Acuna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology and system for wafer-level testing of MEMS pressure sen...
- Patent number 9,527,731
- Issue date Dec 27, 2016
- NXP USA, INC.
- Bruno J. Debeurre
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Pressure sensor having multiple pressure cells and sensitivity esti...
- Patent number 9,488,542
- Issue date Nov 8, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for calibrating transducer-including devices
- Patent number 9,400,226
- Issue date Jul 26, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Raimondo P. Sessego
- G01 - MEASURING TESTING
Information Patent Grant
Transducer-including devices, and methods and apparatus for their c...
- Patent number 9,365,413
- Issue date Jun 14, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Andres Barrilado
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Test structure and methodology for estimating sensitivity of pressu...
- Patent number 9,285,404
- Issue date Mar 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Tester and method for testing a strip of devices
- Patent number 9,285,422
- Issue date Mar 15, 2016
- Freescale Semiconductor Inc.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Pressure sensor with built-in calibration capability
- Patent number 9,285,289
- Issue date Mar 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Active lateral force stiction self-recovery for microelectromechani...
- Patent number 9,213,045
- Issue date Dec 15, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Kemiao Jia
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Pressure sensor having multiple pressure cells and sensitivity esti...
- Patent number 9,176,020
- Issue date Nov 3, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Magnetometer test arrangement and method
- Patent number 8,963,538
- Issue date Feb 24, 2015
- Freescale Semiconductor Inc.
- Peter T. Jones
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTROLLED PULSE GENERATION METHODS AND APPARATUSES FOR EVALUATING...
- Publication number 20170370799
- Publication date Dec 28, 2017
- Freescale Semiconductor Inc.
- PETER T. JONES
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SENSORS
- Publication number 20160116361
- Publication date Apr 28, 2016
- FREESCALE SEMICONDUCTOR, INC.
- BRUNO J. DEBEURRE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHODOLOGY AND SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SEN...
- Publication number 20160107887
- Publication date Apr 21, 2016
- FREESCALE SEMICONDUCTOR, INC.
- BRUNO J. DEBEURRE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PRESSURE SENSOR HAVING MULTIPLE PRESSURE CELLS AND SENSITIVITY ESTI...
- Publication number 20150346046
- Publication date Dec 3, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC PRE-CONDITIONING OF MAGNETIC SENSORS
- Publication number 20150179325
- Publication date Jun 25, 2015
- CARLOS M. ACUNA
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSOR WITH BUILT-IN CALIBRATION CAPABILITY
- Publication number 20150160089
- Publication date Jun 11, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MAGNETOMETER TEST ARRANGEMENT AND METHOD
- Publication number 20150130443
- Publication date May 14, 2015
- Peter T. Jones
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSOR HAVING MULTIPLE PRESSURE CELLS AND SENSITIVITY ESTI...
- Publication number 20150090052
- Publication date Apr 2, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE AND METHODOLOGY FOR ESTIMATING SENSITIVITY OF PRESSU...
- Publication number 20150048848
- Publication date Feb 19, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Application
TRANSDUCER-INCLUDING DEVICES, AND METHODS AND APPARATUS FOR THEIR C...
- Publication number 20140352400
- Publication date Dec 4, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Andres BARRILADO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ACTIVE LATERAL FORCE STICTION SELF-RECOVERY FOR MICROELECTROMECHANI...
- Publication number 20140345380
- Publication date Nov 27, 2014
- Kemiao Jia
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHODS AND APPARATUS FOR CALIBRATING TRANSDUCER-INCLUDING DEVICES
- Publication number 20140303926
- Publication date Oct 9, 2014
- Raimondo P. Sessego
- G01 - MEASURING TESTING
Information Patent Application
TESTER AND METHOD FOR TESTING A STRIP OF DEVICES
- Publication number 20130297248
- Publication date Nov 7, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MAGNETOMETER TEST ARRANGEMENT AND METHOD
- Publication number 20120210562
- Publication date Aug 23, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Peter T. Jones
- G01 - MEASURING TESTING

Peter T. Jones

Person

Patents Grantslast 30 patents

Controlled pulse generation methods and apparatuses for evaluating...

Magnetometer test arrangement and method

Magnetic pre-conditioning of magnetic sensors

Methodology and system for wafer-level testing of MEMS pressure sen...

Pressure sensor having multiple pressure cells and sensitivity esti...

Methods and apparatus for calibrating transducer-including devices

Transducer-including devices, and methods and apparatus for their c...

Test structure and methodology for estimating sensitivity of pressu...

Tester and method for testing a strip of devices

Pressure sensor with built-in calibration capability

Active lateral force stiction self-recovery for microelectromechani...

Pressure sensor having multiple pressure cells and sensitivity esti...

Magnetometer test arrangement and method

Patents Applicationslast 30 patents

CONTROLLED PULSE GENERATION METHODS AND APPARATUSES FOR EVALUATING...

SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SENSORS

METHODOLOGY AND SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SEN...

PRESSURE SENSOR HAVING MULTIPLE PRESSURE CELLS AND SENSITIVITY ESTI...

MAGNETIC PRE-CONDITIONING OF MAGNETIC SENSORS

PRESSURE SENSOR WITH BUILT-IN CALIBRATION CAPABILITY

MAGNETOMETER TEST ARRANGEMENT AND METHOD

PRESSURE SENSOR HAVING MULTIPLE PRESSURE CELLS AND SENSITIVITY ESTI...

TEST STRUCTURE AND METHODOLOGY FOR ESTIMATING SENSITIVITY OF PRESSU...

TRANSDUCER-INCLUDING DEVICES, AND METHODS AND APPARATUS FOR THEIR C...

ACTIVE LATERAL FORCE STICTION SELF-RECOVERY FOR MICROELECTROMECHANI...

METHODS AND APPARATUS FOR CALIBRATING TRANSDUCER-INCLUDING DEVICES

TESTER AND METHOD FOR TESTING A STRIP OF DEVICES

MAGNETOMETER TEST ARRANGEMENT AND METHOD