Peter V. Schwartz

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San Lius Obispo, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Enhanced scanning probe microscope and nanolithographic methods usi...
- Patent number 6,737,646
- Issue date May 18, 2004
- Northwestern University
- Peter V. Schwartz
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced scanning probe microscope
- Patent number 6,674,074
- Issue date Jan 6, 2004
- Northwestern University
- Peter V. Schwartz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Enhanced scanning probe microscope and nanolithographic methods usi...
- Publication number 20030007242
- Publication date Jan 9, 2003
- Peter V. Schwartz
- B82 - NANO-TECHNOLOGY
Information Patent Application
Enhanced scanning probe microscope
- Publication number 20030005755
- Publication date Jan 9, 2003
- Peter V. Schwartz
- B82 - NANO-TECHNOLOGY