TREA

Peter W. NEFF

Follow

Person

  • Cambridge, VT, US
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Compliant wafer probe assembly
    • Patent number 11,675,010
    • Issue date Jun 13, 2023
    • International Business Machines Corporation
    • David Michael Audette
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer probe with elastomer support
    • Patent number 11,662,366
    • Issue date May 30, 2023
    • International Business Machines Corporation
    • David Michael Audette
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card assembly
    • Patent number 11,085,949
    • Issue date Aug 10, 2021
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Repairable rigid test probe card assembly
    • Patent number 10,732,202
    • Issue date Aug 4, 2020
    • GLOBALFOUNDRIES Inc.
    • Craig M. Bocash
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card assembly
    • Patent number 10,578,648
    • Issue date Mar 3, 2020
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gimbal assembly test system and method
    • Patent number 10,514,393
    • Issue date Dec 24, 2019
    • GLOBALFOUNDRIES Inc.
    • David L. Gardell
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Gimbal assembly test system and method
    • Patent number 10,041,976
    • Issue date Aug 7, 2018
    • GLOBALFOUNDRIES Inc.
    • David L. Gardell
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card assembly
    • Patent number 9,797,928
    • Issue date Oct 24, 2017
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CLUSTERED RIGID WAFER TEST PROBE
    • Publication number 20240183880
    • Publication date Jun 6, 2024
    • International Business Machines Corporation
    • David Michael Audette
    • G01 - MEASURING TESTING
  • Information Patent Application

    COMPLIANT WAFER PROBE ASSEMBLY
    • Publication number 20230168301
    • Publication date Jun 1, 2023
    • International Business Machines Corporation
    • David Michael Audette
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER PROBE WITH ELASTOMER SUPPORT
    • Publication number 20230089411
    • Publication date Mar 23, 2023
    • International Business Machines Corporation
    • David Michael Audette
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD ASSEMBLY
    • Publication number 20200049738
    • Publication date Feb 13, 2020
    • International Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING
  • Information Patent Application

    GIMBAL ASSEMBLY TEST SYSTEM AND METHOD
    • Publication number 20180217184
    • Publication date Aug 2, 2018
    • GLOBALFOUNDRIES INC.
    • David L. Gardell
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD ASSEMBLY
    • Publication number 20170356933
    • Publication date Dec 14, 2017
    • International Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING
  • Information Patent Application

    REPAIRABLE RIGID TEST PROBE CARD ASSEMBLY
    • Publication number 20170285068
    • Publication date Oct 5, 2017
    • GLOBALFOUNDRIES INC.
    • CRAIG M. BOCASH
    • G01 - MEASURING TESTING
  • Information Patent Application

    GIMBAL ASSEMBLY TEST SYSTEM AND METHOD
    • Publication number 20170219626
    • Publication date Aug 3, 2017
    • GLOBALFOUNDRIES INC.
    • David L. Gardell
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD ASSEMBLY
    • Publication number 20160077129
    • Publication date Mar 17, 2016
    • International Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING