Peter Weidner

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Rotz, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for determining trench parameters
- Patent number 7,773,232
- Issue date Aug 10, 2010
- Qimonda AG
- Peter Weidner
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring a surface profile of a sample
- Patent number 7,405,089
- Issue date Jul 29, 2008
- Infineon Technologies AG
- Harald Bloess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for monitoring trench profiles and for spectro...
- Patent number 7,372,579
- Issue date May 13, 2008
- Infineon Technologies, AG
- Zhen-Long Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determination of the depth of depressions...
- Patent number 7,152,461
- Issue date Dec 26, 2006
- Infineon Technologies AG
- Dietmar Temmler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Method for Determining Trench Parameters
- Publication number 20080297765
- Publication date Dec 4, 2008
- Qimonda AG
- Peter Weidner
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for monitoring trench profiles and for spectro...
- Publication number 20070247634
- Publication date Oct 25, 2007
- Zhen-Long Chen
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring a surface profile of a sample
- Publication number 20050258365
- Publication date Nov 24, 2005
- Harald Bloess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for determination of the depth of depressions...
- Publication number 20050199078
- Publication date Sep 15, 2005
- Infineon Technologies AG
- Dietmar Temmler
- G01 - MEASURING TESTING
Information Patent Application
Method for determining or inspecting a property of a patterned layer
- Publication number 20050118735
- Publication date Jun 2, 2005
- Ulrich Mantz
- G01 - MEASURING TESTING