Peter Westrom

Person

Phoenix, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and wafer processing furnace for forming an epitaxial stack...
- Patent number 12,362,174
- Issue date Jul 15, 2025
- ASM IP Holding B.V.
- Steven Van Aerde
- C30 - CRYSTAL GROWTH
Information Patent Grant
Methods for silicon germanium uniformity control using multiple pre...
- Patent number 12,057,314
- Issue date Aug 6, 2024
- ASM IP Holding B.V.
- Amir Kajbafvala
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods for thermally calibrating reaction chambers
- Patent number 10,943,771
- Issue date Mar 9, 2021
- ASM IP Holding B.V.
- Hyeongeu Kim
- G01 - MEASURING TESTING
Information Patent Grant
Methods for thermally calibrating reaction chambers
- Patent number 10,643,826
- Issue date May 5, 2020
- ASM IP Holdings B.V.
- Hyeongeu Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR SILICON GERMANIUM UNIFORMITY CONTROL USING MULTIPLE PRE...
- Publication number 20240332016
- Publication date Oct 3, 2024
- ASM IP HOLDING B.V.
- Amir Kajbafvala
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD OF FORMING SILICON WITHIN A GAP ON A SURFACE OF A SUBSTRATE
- Publication number 20230420309
- Publication date Dec 28, 2023
- ASM IP HOLDING B.V.
- Omar Elleuch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND WAFER PROCESSING FURNACE FOR FORMING AN EPITAXIAL STACK...
- Publication number 20230223255
- Publication date Jul 13, 2023
- ASM IP HOLDING, B.V.
- Steven Van Aerde
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD OF FORMING AN EPITAXIAL STACK ON A PLURALITY OF SUBSTRATES
- Publication number 20230220588
- Publication date Jul 13, 2023
- ASM IP HOLDING B.V.
- Steven Van Aerde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMING STRUCTURES WITH BOTTOM-UP FILL TECHNIQUES
- Publication number 20230005744
- Publication date Jan 5, 2023
- ASM IP HOLDING B.V.
- Caleb Miskin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHODS FOR SILICON GERMANIUM UNIFORMITY CONTROL USING MULTIPLE PRE...
- Publication number 20210358741
- Publication date Nov 18, 2021
- ASM IP HOLDING B.V.
- Amir Kajbafvala
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS INJECTION SYSTEM AND REACTOR SYSTEM INCLUDING SAME
- Publication number 20210102290
- Publication date Apr 8, 2021
- ASM IP HOLDING B.V.
- Tomas Hernandez Acosta
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHODS FOR THERMALLY CALIBRATING REACTION CHAMBERS
- Publication number 20200227243
- Publication date Jul 16, 2020
- ASM IP HOLDING B.V.
- Hyeongeu Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHODS FOR THERMALLY CALIBRATING REACTION CHAMBERS
- Publication number 20180114680
- Publication date Apr 26, 2018
- ASM IP HOLDING B.V.
- Hyeongeu Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Peter Westrom

Person

Patents Grantslast 30 patents

Method and wafer processing furnace for forming an epitaxial stack...

Methods for silicon germanium uniformity control using multiple pre...

Methods for thermally calibrating reaction chambers

Methods for thermally calibrating reaction chambers

Patents Applicationslast 30 patents

METHODS FOR SILICON GERMANIUM UNIFORMITY CONTROL USING MULTIPLE PRE...

METHOD OF FORMING SILICON WITHIN A GAP ON A SURFACE OF A SUBSTRATE

METHOD AND WAFER PROCESSING FURNACE FOR FORMING AN EPITAXIAL STACK...

METHOD OF FORMING AN EPITAXIAL STACK ON A PLURALITY OF SUBSTRATES

FORMING STRUCTURES WITH BOTTOM-UP FILL TECHNIQUES

METHODS FOR SILICON GERMANIUM UNIFORMITY CONTROL USING MULTIPLE PRE...

GAS INJECTION SYSTEM AND REACTOR SYSTEM INCLUDING SAME

METHODS FOR THERMALLY CALIBRATING REACTION CHAMBERS

METHODS FOR THERMALLY CALIBRATING REACTION CHAMBERS