Petr Hlavenka

Person

Brno, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device for inspection of a specimen with a pl...
- Patent number 11,676,795
- Issue date Jun 13, 2023
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for component analysis of spectral data
- Patent number 11,373,839
- Issue date Jun 28, 2022
- FEI Company
- Petr Hlavenka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,002,692
- Issue date May 11, 2021
- FEI Company
- Tomas Tuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam electron microscope
- Patent number 10,937,627
- Issue date Mar 2, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using a compound particle-optical lens
- Patent number 9,490,100
- Issue date Nov 8, 2016
- FEI Company
- Petr Sytar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-column detector for particle-optical column
- Patent number 9,362,086
- Issue date Jun 7, 2016
- FEI Company
- Lubomír Tůma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection method for use in charged-particle microscopy
- Patent number 9,153,416
- Issue date Oct 6, 2015
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Grant
Method for imaging a sample in a charged particle apparatus
- Patent number 9,053,899
- Issue date Jun 9, 2015
- FEI COMPANY
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for use in charged-particle microscopy
- Patent number 8,735,849
- Issue date May 27, 2014
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20240027377
- Publication date Jan 25, 2024
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20210296088
- Publication date Sep 23, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20200312610
- Publication date Oct 1, 2020
- FEI Company
- Petr Hlavenka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200057011
- Publication date Feb 20, 2020
- FEI Company
- Tomas Tuma
- G01 - MEASURING TESTING
Information Patent Application
MULTI-BEAM ELECTRON MICROSCOPE
- Publication number 20190378681
- Publication date Dec 12, 2019
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING...
- Publication number 20180061613
- Publication date Mar 1, 2018
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INVESTIGATION OF HIGH-TEMPERATURE SPECIMENS IN A CHARGED PARTICLE M...
- Publication number 20170103868
- Publication date Apr 13, 2017
- FEI Company
- Libor Novak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION METHOD FOR USE IN CHARGED-PARTICLE MICROSCOPY
- Publication number 20140374593
- Publication date Dec 25, 2014
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMAGING A SAMPLE IN A CHARGED PARTICLE APPARATUS
- Publication number 20140361165
- Publication date Dec 11, 2014
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN
- Publication number 20140097341
- Publication date Apr 10, 2014
- FEI Company
- Lubomir Tuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Using a Compound Particle-Optical Lens
- Publication number 20140070098
- Publication date Mar 13, 2014
- FEI Company
- Petr Sytar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN
- Publication number 20120273677
- Publication date Nov 1, 2012
- FEI Company
- Lubomir Tuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector for Use in Charged-Particle Microscopy
- Publication number 20120205539
- Publication date Aug 16, 2012
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING

Petr Hlavenka

Person

Patents Grantslast 30 patents

Charged particle beam device for inspection of a specimen with a pl...

Method and system for component analysis of spectral data

Method of examining a sample using a charged particle microscope

Multi-beam electron microscope

Method of using a compound particle-optical lens

In-column detector for particle-optical column

Detection method for use in charged-particle microscopy

Method for imaging a sample in a charged particle apparatus

Detector for use in charged-particle microscopy

Patents Applicationslast 30 patents

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

MULTI-BEAM ELECTRON MICROSCOPE

CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING...

INVESTIGATION OF HIGH-TEMPERATURE SPECIMENS IN A CHARGED PARTICLE M...

DETECTION METHOD FOR USE IN CHARGED-PARTICLE MICROSCOPY

METHOD FOR IMAGING A SAMPLE IN A CHARGED PARTICLE APPARATUS

IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN

Method of Using a Compound Particle-Optical Lens

IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN

Detector for Use in Charged-Particle Microscopy