Petra Hetzer

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
DRAM cell based on conductive nanochannel plate
- Patent number 9,006,906
- Issue date Apr 14, 2015
- GLOBALFOUNDRIES Inc.
- Dmytro Chumakov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for particles analysis in microstructure devices...
- Patent number 8,925,396
- Issue date Jan 6, 2015
- GLOBALFOUNDRIES Inc.
- Petra Hetzer
- G01 - MEASURING TESTING
Information Patent Grant
DRAM cell based on conductive nanochannel plate
- Patent number 8,785,271
- Issue date Jul 22, 2014
- GLOBALFOUNDRIES, INC.
- Dmytro Chumakov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for extracting samples after patterning of micros...
- Patent number 8,435,885
- Issue date May 7, 2013
- GLOBALFOUNDRIES, INC.
- Dmytro Chumakov
- G01 - MEASURING TESTING
Information Patent Grant
Technique for forming interconnect structures with reduced electro...
- Patent number 7,375,031
- Issue date May 20, 2008
- Advanced Micro Devices, Inc.
- Axel Preusse
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DRAM CELL BASED ON CONDUCTIVE NANOCHANNEL PLATE
- Publication number 20140299929
- Publication date Oct 9, 2014
- Dmytro CHUMAKOV
- B82 - NANO-TECHNOLOGY
Information Patent Application
DRAM CELL BASED ON CONDUCTIVE NANOCHANNEL PLATE
- Publication number 20120193807
- Publication date Aug 2, 2012
- GLOBALFOUNDRIES INC.
- Dmytro Chumakov
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and System for Extracting Samples After Patterning of Micros...
- Publication number 20120052601
- Publication date Mar 1, 2012
- GLOBALFOUNDRIES INC.
- Dmytro Chumakov
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL STRIPPING IN SEMICONDUCTOR DEVICES BY EVAPORATION
- Publication number 20100248498
- Publication date Sep 30, 2010
- Petra Hetzer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR PARTICLES ANALYSIS IN MICROSTRUCTURE DEVICES...
- Publication number 20100242631
- Publication date Sep 30, 2010
- Petra Hetzer
- G01 - MEASURING TESTING
Information Patent Application
Technique for forming interconnect structures with reduced electro...
- Publication number 20060223311
- Publication date Oct 5, 2006
- Wolfgang Buchholtz
- H01 - BASIC ELECTRIC ELEMENTS