Petronella Emerentiana Hegeman

Person

Borne, NL

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray tube and X-ray analysis system
- Patent number 11,315,749
- Issue date Apr 26, 2022
- Malvern Panalytical B.V.
- Harry Berkhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conical collimator for X-ray measurements
- Patent number 10,393,683
- Issue date Aug 27, 2019
- Malvern Panalytical B.V.
- Petronella Emerentiana Hegeman
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Conical collimator for X-ray measurements
- Patent number 10,281,414
- Issue date May 7, 2019
- Malvern Panalytical B.V.
- Petronella Emerentiana Hegeman
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Quantitative X-ray analysis—matrix thickness correction
- Patent number 9,784,699
- Issue date Oct 10, 2017
- PANalytical B.V.
- Charalampos Zarkadas
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative X-ray analysis—multi optical path instrument
- Patent number 9,739,730
- Issue date Aug 22, 2017
- PANalytical B.V.
- Petronella Emerentiana Hegeman
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for performing X-ray analysis
- Patent number 7,949,092
- Issue date May 24, 2011
- PANalytical B.V.
- Gustaaf Christian Simon Brons
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-ray Tube and X-Ray Analysis System
- Publication number 20200258711
- Publication date Aug 13, 2020
- MALVERN PANALYTICAL B.V.
- Harry BERKHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conical Collimator for X-ray Measurements
- Publication number 20190204246
- Publication date Jul 4, 2019
- MALVERN PANALYTICAL B.V.
- Petronella Emerentiana HEGEMAN
- B22 - CASTING POWDER METALLURGY
Information Patent Application
Conical Collimator for X-ray Measurements
- Publication number 20180156745
- Publication date Jun 7, 2018
- MALVERN PANALYTICAL B.V.
- Petronella Emerentiana HEGEMAN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Quantitative X-ray Analysis - Multi optical path instrument
- Publication number 20160258892
- Publication date Sep 8, 2016
- PANALYTICAL B.V.
- Petronella Emerentiana Hegeman
- G01 - MEASURING TESTING
Information Patent Application
Quantitative X-ray Analysis - Matrix thickness correction
- Publication number 20160258890
- Publication date Sep 8, 2016
- PANALYTICAL B.V.
- Charalampos Zarkadas
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING A MULTILAYER STRUCTURE WITH A LATERAL PATT...
- Publication number 20130220971
- Publication date Aug 29, 2013
- PANALYTICAL B.V.
- Frederik Bijkerk
- B82 - NANO-TECHNOLOGY
Information Patent Application
DEVICE AND METHOD FOR PERFORMING X-RAY ANALYSIS
- Publication number 20110058648
- Publication date Mar 10, 2011
- PANALYTICAL B.V.
- Gustaaf Christian Simon Brons
- G01 - MEASURING TESTING
Information Patent Application
Device and method for performing X-ray analysis
- Publication number 20080037706
- Publication date Feb 14, 2008
- PANalytical B.V.
- Gustaaf Christian Simon Brons
- G01 - MEASURING TESTING

Petronella Emerentiana Hegeman

Person

Patents Grantslast 30 patents

X-ray tube and X-ray analysis system

Conical collimator for X-ray measurements

Conical collimator for X-ray measurements

Quantitative X-ray analysis—matrix thickness correction

Quantitative X-ray analysis—multi optical path instrument

Device and method for performing X-ray analysis

Patents Applicationslast 30 patents

X-ray Tube and X-Ray Analysis System

Conical Collimator for X-ray Measurements

Conical Collimator for X-ray Measurements

Quantitative X-ray Analysis - Multi optical path instrument

Quantitative X-ray Analysis - Matrix thickness correction

METHOD FOR MANUFACTURING A MULTILAYER STRUCTURE WITH A LATERAL PATT...

DEVICE AND METHOD FOR PERFORMING X-RAY ANALYSIS

Device and method for performing X-ray analysis