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Petrus Henricus Antonius Mutsaers
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Geldrop, NL
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Patents Grants
last 30 patents
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Patent Grant
Time-of-flight charged particle spectroscopy
Patent number
9,984,852
Issue date
May 29, 2018
FEI Company
Otger Jan Luiten
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Beam pulsing device for use in charged-particle microscopy
Patent number
9,048,060
Issue date
Jun 2, 2015
FEI Company
Erik René Kieft
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
TIME-OF-FLIGHT CHARGED PARTICLE SPECTROSCOPY
Publication number
20180151329
Publication date
May 31, 2018
FEI Company
Otger Jom Luiten
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BEAM PULSING DEVICE FOR USE IN CHARGED-PARTICLE MICROSCOPY
Publication number
20140103225
Publication date
Apr 17, 2014
FEI Company
Erik René Kieft
H01 - BASIC ELECTRIC ELEMENTS