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PETRUS J. UITTERHOEVE
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EINDHOVEN, NL
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Patents Grants
last 30 patents
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Patent Grant
Method of inspecting a substrate furnished with a phosphor layer
Patent number
6,333,500
Issue date
Dec 25, 2001
U.S. Philips Corporation
Frederik C. Gehring
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
METHOD OF INSPECTIONG A SUBSTRATE FURNISHED WITH A PHOSPHOR LAYER
Publication number
20010045519
Publication date
Nov 29, 2001
FREDERIK C. GEHRING
G01 - MEASURING TESTING