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Petrus Stephanus van Zyl
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's-Gravenhage, NL
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last 30 patents
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Patent Grant
System and method for defect monitoring
Patent number
9,970,905
Issue date
May 15, 2018
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Arno Willem Frederik Volker
G01 - MEASURING TESTING
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last 30 patents
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SYSTEM AND METHOD FOR DEFECT MONITORING
Publication number
20160202213
Publication date
Jul 14, 2016
Arno Willem Frederik Volker
G01 - MEASURING TESTING