Philip D. Flanner III

Follow

Person

Union City, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Calculated electrical performance metrics for process monitoring an...
- Patent number 10,079,183
- Issue date Sep 18, 2018
- KLA-Tenor Corporation
- Xiang Gao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for optimized scatterometry
- Patent number 9,127,927
- Issue date Sep 8, 2015
- KLA-Tencor Corporation
- Jonathan Iloreta
- G01 - MEASURING TESTING
Information Patent Grant
High throughput thin film characterization and defect detection
- Patent number 8,711,349
- Issue date Apr 29, 2014
- KLA-Tencor Corporation
- Xiang Gao
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for calibrating an ellipsometer
- Patent number 5,581,350
- Issue date Dec 3, 1996
- Tencor Instruments
- Xing Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Calculated Electrical Performance Metrics For Process Monitoring An...
- Publication number 20150006097
- Publication date Jan 1, 2015
- KLA-Tencor Corporation
- Xiang Gao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR OPTIMIZED SCATTEROMETRY
- Publication number 20130158948
- Publication date Jun 20, 2013
- Jonathan Iloreta
- G01 - MEASURING TESTING
Information Patent Application
High Throughput Thin Film Characterization And Defect Detection
- Publication number 20130083320
- Publication date Apr 4, 2013
- KLA-Tencor Corporation
- Xiang Gao
- G01 - MEASURING TESTING