Philip Dextras

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for extended time and varying environment meas...
- Patent number 8,631,685
- Issue date Jan 21, 2014
- Massachusetts Institute of Technology
- Scott Manalis
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for integrated measurement of the mass and sur...
- Patent number 8,418,535
- Issue date Apr 16, 2013
- Massachusetts Institute of Technology
- Scott Manalis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for integrated measurement of the mass and sur...
- Publication number 20110271747
- Publication date Nov 10, 2011
- Scott Manalis
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for extended time and varying environment meas...
- Publication number 20100288043
- Publication date Nov 18, 2010
- Scott Manalis
- G01 - MEASURING TESTING