Philip John King

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South Woodham Ferrers, GB

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection apparatus for inspecting semiconductor wafers
- Patent number 10,948,425
- Issue date Mar 16, 2021
- Nordson Corporation
- William T. Walker
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 10,393,675
- Issue date Aug 27, 2019
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing of bonds of a semiconductor assembly
- Patent number 8,844,368
- Issue date Sep 30, 2014
- Nordson Corporation
- Benjamin K. Peecock
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20170122883
- Publication date May 4, 2017
- Nordson Corporation
- William T. WALKER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20170025317
- Publication date Jan 26, 2017
- Nordson Corporation
- John TINGAY
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING OF BONDS OF A SEMICONDUCTOR ASSEMBLY
- Publication number 20110277555
- Publication date Nov 17, 2011
- Nordson Corporation
- Benjamin K. Peecock
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING OF BONDS OF A SEMICONDUCTOR ASSEMBLY
- Publication number 20110277556
- Publication date Nov 17, 2011
- Nordson Corporation
- Benjamin K. Peecock
- G01 - MEASURING TESTING