Philip L. Wylie

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Kennett Sq., PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Spectral axis transform
- Patent number 7,022,980
- Issue date Apr 4, 2006
- Agilent Technologies, Inc.
- A. Paul Zavitsanos
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic library searching
- Patent number 6,936,813
- Issue date Aug 30, 2005
- Agilent Technologies, Inc.
- A. Paul Zavitsanos
- G01 - MEASURING TESTING
Information Patent Grant
Retention time-locked spectral database for target analyte analysis
- Patent number 5,939,612
- Issue date Aug 17, 1999
- Hewlett-Packard Company
- Philip L. Wylie
- G01 - MEASURING TESTING
Information Patent Grant
Method for sample identification using a locked retention time data...
- Patent number 5,827,946
- Issue date Oct 27, 1998
- Hewlett-Packard Company
- Matthew S. Klee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DYNAMIC LIBRARY SEARCHING
- Publication number 20050167581
- Publication date Aug 4, 2005
- A. Paul Zavitsanos
- G01 - MEASURING TESTING