Philip Measor

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect discovery and recipe optimization for inspection of three-di...
- Patent number 11,047,806
- Issue date Jun 29, 2021
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional calibration structures and methods for measuring...
- Patent number 10,928,740
- Issue date Feb 23, 2021
- KLA Corporation
- Philip Measor
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional imaging for semiconductor wafer inspection
- Patent number 10,887,580
- Issue date Jan 5, 2021
- KLA-Tencor Corporation
- Pavel Kolchin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reverse decoration for defect detection amplification
- Patent number 10,249,546
- Issue date Apr 2, 2019
- KLA-Tencor Corporation
- Philip Measor
- G01 - MEASURING TESTING
Information Patent Grant
System and method for dynamic care area generation on an inspection...
- Patent number 10,018,571
- Issue date Jul 10, 2018
- KLA-Tencor Corporation
- Vijayakumar Ramachandran
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Three-Dimensional Calibration Structures and Methods for Measuring...
- Publication number 20180224749
- Publication date Aug 9, 2018
- KLA-Tencor Corporation
- Philip Measor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Defect Discovery And Recipe Optimization For Inspection Of Three-Di...
- Publication number 20180149603
- Publication date May 31, 2018
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Three-Dimensional Imaging For Semiconductor Wafer Inspection
- Publication number 20180103247
- Publication date Apr 12, 2018
- KLA-Tencor Corporation
- Pavel Kolchin
- G01 - MEASURING TESTING
Information Patent Application
Reverse Decoration for Defect Detection Amplification
- Publication number 20180025952
- Publication date Jan 25, 2018
- KLA-Tencor Corporation
- Philip Measor
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Dynamic Care Area Generation on an Inspection...
- Publication number 20160377561
- Publication date Dec 29, 2016
- KLA-Tencor Corporation
- Vijayakumar Ramachandran
- G01 - MEASURING TESTING