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Philip Neaves
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Woking, GB
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Patents Grants
last 30 patents
Information
Patent Grant
Structure and method for forming a capacitively coupled chip-to-chi...
Patent number
8,049,331
Issue date
Nov 1, 2011
Micron Technology, Inc.
Philip Neaves
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Structure and method for forming a capacitively coupled chip-to-chi...
Patent number
7,763,497
Issue date
Jul 27, 2010
Micron Technology, Inc.
Philip Neaves
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low power comparator
Patent number
7,612,816
Issue date
Nov 3, 2009
Micron Technology, Inc.
Philip Neaves
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for improving pixel output swing in imager sen...
Patent number
7,477,306
Issue date
Jan 13, 2009
Micron Technology, Inc.
Philip Neaves
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Structure and method for forming a capacitively coupled chip-to-chi...
Patent number
7,462,935
Issue date
Dec 9, 2008
Micron Technology, Inc.
Philip Neaves
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for testing devices utilizing capacitively couple...
Patent number
7,352,201
Issue date
Apr 1, 2008
Micron Technology, Inc.
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Grant
System and method for testing devices utilizing capacitively couple...
Patent number
7,276,928
Issue date
Oct 2, 2007
Micron Technology, Inc.
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Grant
System and method for testing devices utilizing capacitively couple...
Patent number
7,274,204
Issue date
Sep 25, 2007
Micron Technology, Inc.
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Grant
System and method for testing devices utilizing capacitively couple...
Patent number
7,274,205
Issue date
Sep 25, 2007
Micron Technology, Inc.
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Grant
System and method for testing devices utilizing capacitively couple...
Patent number
7,183,790
Issue date
Feb 27, 2007
Micron Technology, Inc.
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Grant
Bandgap reference circuit with a shared resistive network
Patent number
7,164,260
Issue date
Jan 16, 2007
Micron Technology, Inc.
Philip Neaves
G05 - CONTROLLING REGULATING
Information
Patent Grant
System and method for testing devices utilizing capacitively couple...
Patent number
7,112,980
Issue date
Sep 26, 2006
Micron Technology, Inc.
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Grant
System and method for balancing capacitively coupled signal lines
Patent number
7,075,330
Issue date
Jul 11, 2006
Micron Technology, Inc.
Philip Neaves
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Low resistance bandgap reference circuit with resistive T-network
Patent number
7,009,374
Issue date
Mar 7, 2006
Micron Technology Inc.
Philip Neaves
G05 - CONTROLLING REGULATING
Information
Patent Grant
System and method for balancing capacitively coupled signal lines
Patent number
6,937,067
Issue date
Aug 30, 2005
Micron Technology, Inc.
Philip Neaves
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
STRUCTURE AND METHOD FOR FORMING A CAPACITIVELY COUPLED CHIP-TO-CHI...
Publication number
20100283158
Publication date
Nov 11, 2010
Micron Technology, Inc.
Philip Neaves
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STRUCTURE AND METHOD FOR FORMING A CAPACITIVELY COUPLED CHIP-TO-CHI...
Publication number
20090072389
Publication date
Mar 19, 2009
Micron Technology, Inc.
Philip Neaves
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System and method for testing devices utilizing capacitively couple...
Publication number
20060181301
Publication date
Aug 17, 2006
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Application
System and method for testing devices utilizing capacitively couple...
Publication number
20060170446
Publication date
Aug 3, 2006
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Application
System and method for testing devices utilizing capacitively couple...
Publication number
20060152244
Publication date
Jul 13, 2006
School Juridical Person, Kinki University
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Application
System and method for testing devices utilizing capacitively couple...
Publication number
20060152243
Publication date
Jul 13, 2006
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Application
Low voltage bandgap reference circuit with reduced area
Publication number
20060108994
Publication date
May 25, 2006
Micron Technology, Inc.
Philip Neaves
G05 - CONTROLLING REGULATING
Information
Patent Application
Method and apparatus for improving pixel output swing in imager sen...
Publication number
20060044412
Publication date
Mar 2, 2006
Philip Neaves
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
System and method for balancing capacitively coupled signal lines
Publication number
20050280444
Publication date
Dec 22, 2005
Philip Neaves
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
System and method for testing devices utilizing capacitively couple...
Publication number
20050206403
Publication date
Sep 22, 2005
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Application
Low power comparator
Publication number
20050179470
Publication date
Aug 18, 2005
Philip Neaves
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Structure and method for forming a capacitively coupled chip-to-chi...
Publication number
20050077546
Publication date
Apr 14, 2005
Philip Neaves
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Low voltage bandgap reference circuit with reduced area
Publication number
20050052173
Publication date
Mar 10, 2005
Philip Neaves
G05 - CONTROLLING REGULATING
Information
Patent Application
System and method for testing devices utilizing capacitively couple...
Publication number
20050040839
Publication date
Feb 24, 2005
Philip Neaves
G01 - MEASURING TESTING
Information
Patent Application
System and method for balancing capacitively coupled signal lines
Publication number
20040235265
Publication date
Nov 25, 2004
Philip Neaves
H04 - ELECTRIC COMMUNICATION TECHNIQUE