Philip Neil Shaw

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Warrington, GB

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Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometry for gas analysis with a one-stage charged particl...
- Patent number 8,796,620
- Issue date Aug 5, 2014
- MKS Instruments, Inc.
- Philip Neil Shaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry for a gas analysis with a two-stage charged parti...
- Patent number 8,796,638
- Issue date Aug 5, 2014
- MKS Instruments, Inc.
- Philip Neil Shaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry for gas analysis in which both a charged particle...
- Patent number 8,450,681
- Issue date May 28, 2013
- MKS Instruments, Inc.
- Philip Neil Shaw
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Mass Spectrometry for Gas Analysis in Which both a Charged Particle...
- Publication number 20120312978
- Publication date Dec 13, 2012
- MKS Instruments, Inc.
- Philip Neil Shaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry for a Gas Analysis with a Two-Stage Charged Parti...
- Publication number 20120313004
- Publication date Dec 13, 2012
- MKS Instruments, Inc.
- Philip Neil Shaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry for Gas Analysis with a One-Stage Charged Particl...
- Publication number 20120312984
- Publication date Dec 13, 2012
- MKS Instruments, Inc.
- Philip Neil Shaw
- H01 - BASIC ELECTRIC ELEMENTS