Philip R. Bingham

Person

Knoxville, TN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical array for high-quality imaging in harsh environments
- Patent number 11,601,601
- Issue date Mar 7, 2023
- UT-Battelle, LLC
- Justin S. Baba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical array for high-quality imaging in harsh environments
- Patent number 10,742,894
- Issue date Aug 11, 2020
- UT-Battelle, LLC
- Justin S. Baba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
CTIR spectrometer for large area assessment of gas emissions
- Patent number 10,585,253
- Issue date Mar 10, 2020
- UT-Battelle, LLC
- Philip R. Bingham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-particle inspection using associated particle sources
- Patent number 9,261,468
- Issue date Feb 16, 2016
- UT-Battelle, LLC
- Philip R. Bingham
- G01 - MEASURING TESTING
Information Patent Grant
Multiple source associated particle imaging for simultaneous captur...
- Patent number 8,586,939
- Issue date Nov 19, 2013
- UT-Battelle, LLC
- Philip R. Bingham
- G01 - MEASURING TESTING
Information Patent Grant
Positron emission imaging device and method of using the same
- Patent number 8,354,651
- Issue date Jan 15, 2013
- UT-Battelle, LLC
- Philip R. Bingham
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method to achieve high-resolution microscopy with non...
- Patent number 8,304,737
- Issue date Nov 6, 2012
- UT-Battelle, LLC
- Kenneth W. Tobin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative phase-contrast and excitation-emission systems
- Patent number 8,264,694
- Issue date Sep 11, 2012
- UT-Battelle, LLC
- Christopher J. Mann
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative phase-imaging systems
- Patent number 8,248,614
- Issue date Aug 21, 2012
- UT-Battelle, LLC
- Christopher J. Mann
- G01 - MEASURING TESTING
Information Patent Grant
Three wavelength quantitative imaging systems
- Patent number 7,978,336
- Issue date Jul 12, 2011
- UT-Battelle, LLC
- Christopher J. Mann
- G01 - MEASURING TESTING
Information Patent Grant
Faster processing of multiple spatially-heterodyned direct to digit...
- Patent number 7,423,763
- Issue date Sep 9, 2008
- U.T. Battelle LLC
- Gregory R. Hanson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Recording multiple spatially-heterodyned direct to digital hologram...
- Patent number 7,349,100
- Issue date Mar 25, 2008
- U.T. Battelle LLC
- Gregory R. Hanson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Two-wavelength spatial-heterodyne holography
- Patent number 7,312,875
- Issue date Dec 25, 2007
- U.T. Battelle LLC
- Gregory R. Hanson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Spatial-heterodyne interferometry for transmission (SHIFT) measurem...
- Patent number 7,119,905
- Issue date Oct 10, 2006
- U.T. Battelle LLC
- Philip R. Bingham
- G01 - MEASURING TESTING
Information Patent Grant
Faster processing of multiple spatially-heterodyned direct to digit...
- Patent number 7,116,425
- Issue date Oct 3, 2006
- U.T. Battelle LLC
- Gregory R. Hanson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Spatial-heterodyne interferometry for reflection and transmission (...
- Patent number 6,999,178
- Issue date Feb 14, 2006
- U.T. Battelle LLC
- Gregory R. Hanson
- G01 - MEASURING TESTING
Information Patent Grant
Fused off-axis object illumination direct-to-digital holography wit...
- Patent number 6,963,406
- Issue date Nov 8, 2005
- UT-Battelle, LLC
- Jeffery R. Price
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR ARTIFACT REDUCTION OF COMPUTED TOMOGRAPHY REC...
- Publication number 20220035961
- Publication date Feb 3, 2022
- UT-Battelle, LLC
- Amir Ziabari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL ARRAY FOR HIGH-QUALITY IMAGING IN HARSH ENVIRONMENTS
- Publication number 20210195086
- Publication date Jun 24, 2021
- UT-Battelle, LLC
- Justin S. Baba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL ARRAY FOR HIGH-QUALITY IMAGING IN HARSH ENVIRONMENTS
- Publication number 20190052792
- Publication date Feb 14, 2019
- UT-Battelle, LLC
- Justin S. Baba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CTIR SPECTROMETER FOR LARGE AREA ASSESSMENT OF GAS EMISSIONS
- Publication number 20170322383
- Publication date Nov 9, 2017
- UT-Battelle, LLC
- Philip R. Bingham
- G02 - OPTICS
Information Patent Application
MULTI-PARTICLE INSPECTION USING ASSOCIATED PARTICLE SOURCES
- Publication number 20130264486
- Publication date Oct 10, 2013
- Philip R. Bingham
- G01 - MEASURING TESTING
Information Patent Application
Multiple source associated particle imaging for simultaneous captur...
- Publication number 20120019510
- Publication date Jan 26, 2012
- UT-BATTELLE, LLC.
- Philip R. Bingham
- G01 - MEASURING TESTING
Information Patent Application
POSITRON EMISSION IMAGING DEVICE AND METHOD OF USING THE SAME
- Publication number 20120001064
- Publication date Jan 5, 2012
- PHILIP R. BINGHAM
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD TO ACHIEVE HIGH-RESOLUTION MICROSCOPY WITH NON...
- Publication number 20110079725
- Publication date Apr 7, 2011
- UT-Battelle, LLC
- Kenneth W. Tobin, JR.
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE PHASE-IMAGING SYSTEMS
- Publication number 20100231895
- Publication date Sep 16, 2010
- Christopher J. Mann
- G01 - MEASURING TESTING
Information Patent Application
Three wavelength quantitative imaging systems
- Publication number 20100231918
- Publication date Sep 16, 2010
- Christopher J. Mann
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE PHASE-CONTRAST AND EXCITATION-EMISSION SYSTEMS
- Publication number 20100231896
- Publication date Sep 16, 2010
- Christopher J. Mann
- G02 - OPTICS
Information Patent Application
Faster processing of multiple spatially-heterodyned direct to digit...
- Publication number 20060238772
- Publication date Oct 26, 2006
- Gregory R. Hanson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Spatial-heterodyne interferometry for transmission (SHIFT) measurem...
- Publication number 20060192972
- Publication date Aug 31, 2006
- Philip R. Bingham
- G01 - MEASURING TESTING
Information Patent Application
Spatial-heterodyne interferometry for reflection and transmission (...
- Publication number 20050046858
- Publication date Mar 3, 2005
- Gregory R. Hanson
- G01 - MEASURING TESTING
Information Patent Application
Spatial-heterodyne interferometry for transmission (SHIFT) measurem...
- Publication number 20050046857
- Publication date Mar 3, 2005
- Philip R. Bingham
- G01 - MEASURING TESTING
Information Patent Application
Faster processing of multiple spatially-heterodyned direct to digit...
- Publication number 20040212807
- Publication date Oct 28, 2004
- Gregory R. Hanson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Two-wavelength spatial-heterodyne holography
- Publication number 20040213462
- Publication date Oct 28, 2004
- Gregory R. Hanson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Recording multiple spatially-heterodyned direct to digital hologram...
- Publication number 20040213464
- Publication date Oct 28, 2004
- Gregory R. Hanson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Rapid acquisition fused off-axis illumination direct-to-digital hol...
- Publication number 20040042056
- Publication date Mar 4, 2004
- Jeffery R. Price
- G01 - MEASURING TESTING

Philip R. Bingham

Person

Patents Grantslast 30 patents

Optical array for high-quality imaging in harsh environments

Optical array for high-quality imaging in harsh environments

CTIR spectrometer for large area assessment of gas emissions

Multi-particle inspection using associated particle sources

Multiple source associated particle imaging for simultaneous captur...

Positron emission imaging device and method of using the same

Apparatus and method to achieve high-resolution microscopy with non...

Quantitative phase-contrast and excitation-emission systems

Quantitative phase-imaging systems

Three wavelength quantitative imaging systems

Faster processing of multiple spatially-heterodyned direct to digit...

Recording multiple spatially-heterodyned direct to digital hologram...

Two-wavelength spatial-heterodyne holography

Spatial-heterodyne interferometry for transmission (SHIFT) measurem...

Faster processing of multiple spatially-heterodyned direct to digit...

Spatial-heterodyne interferometry for reflection and transmission (...

Fused off-axis object illumination direct-to-digital holography wit...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR ARTIFACT REDUCTION OF COMPUTED TOMOGRAPHY REC...

OPTICAL ARRAY FOR HIGH-QUALITY IMAGING IN HARSH ENVIRONMENTS

OPTICAL ARRAY FOR HIGH-QUALITY IMAGING IN HARSH ENVIRONMENTS

CTIR SPECTROMETER FOR LARGE AREA ASSESSMENT OF GAS EMISSIONS

MULTI-PARTICLE INSPECTION USING ASSOCIATED PARTICLE SOURCES

Multiple source associated particle imaging for simultaneous captur...

POSITRON EMISSION IMAGING DEVICE AND METHOD OF USING THE SAME

APPARATUS AND METHOD TO ACHIEVE HIGH-RESOLUTION MICROSCOPY WITH NON...

QUANTITATIVE PHASE-IMAGING SYSTEMS

Three wavelength quantitative imaging systems

QUANTITATIVE PHASE-CONTRAST AND EXCITATION-EMISSION SYSTEMS

Faster processing of multiple spatially-heterodyned direct to digit...

Spatial-heterodyne interferometry for transmission (SHIFT) measurem...

Spatial-heterodyne interferometry for reflection and transmission (...

Spatial-heterodyne interferometry for transmission (SHIFT) measurem...

Faster processing of multiple spatially-heterodyned direct to digit...

Two-wavelength spatial-heterodyne holography

Recording multiple spatially-heterodyned direct to digital hologram...

Rapid acquisition fused off-axis illumination direct-to-digital hol...