Philip S. Stevens

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Williston, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method with system and program product for prioritizing clock domai...
- Patent number 9,194,916
- Issue date Nov 24, 2015
- GLOBALFOUNDRIES Inc.
- Douglas E. Sprague
- G01 - MEASURING TESTING
Information Patent Grant
Functional frequency testing of integrated circuits
- Patent number 7,840,864
- Issue date Nov 23, 2010
- International Business Machines Corporation
- Gary D. Grise
- G01 - MEASURING TESTING
Information Patent Grant
Functional frequency testing of integrated circuits
- Patent number 7,840,863
- Issue date Nov 23, 2010
- International Business Machines Corporation
- Gary D. Grise
- G01 - MEASURING TESTING
Information Patent Grant
Functional frequency testing of integrated circuits
- Patent number 7,698,611
- Issue date Apr 13, 2010
- International Business Machines Corporation
- Gary Grise
- G01 - MEASURING TESTING
Information Patent Grant
Functional frequency testing of integrated circuits
- Patent number 7,290,191
- Issue date Oct 30, 2007
- International Business Machines Corporation
- Gary D. Grise
- G01 - MEASURING TESTING
Information Patent Grant
Extended peripheral bus with bidirectional transmission
- Patent number 5,724,606
- Issue date Mar 3, 1998
- International Business Machines Corporation
- Phillip M. Stevens
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD WITH SYSTEM AND PROGRAM PRODUCT FOR PRIORITIZING CLOCK DOMAI...
- Publication number 20150185286
- Publication date Jul 2, 2015
- International Business Machines Corporation
- Douglas E. Sprague
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL FREQUENCY TESTING OF INTEGRATED CIRCUITS
- Publication number 20100088561
- Publication date Apr 8, 2010
- International Business Machines Corporation
- Gary D. Grise
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FUNCTIONAL FREQUENCY TESTING OF INTEGRATED CIRCUITS
- Publication number 20100088562
- Publication date Apr 8, 2010
- International Business Machines Corporation
- Gary D. Grise
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FUNCTIONAL FREQUENCY TESTING OF INTEGRATED CIRCUITS
- Publication number 20070283201
- Publication date Dec 6, 2007
- Gary D. Grise
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FUNCTIONAL FREQUENCY TESTING OF INTEGRATED CIRCUITS
- Publication number 20060041802
- Publication date Feb 23, 2006
- International Business Machines Corporation
- Gary D. Grise
- H03 - BASIC ELECTRONIC CIRCUITRY