Philip T. Kuglin

Person

Tualatin, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Triggered integrated circuit tester
- Patent number 6,392,404
- Issue date May 21, 2002
- Credence Systems Corporation
- Philip T. Kuglin
- G01 - MEASURING TESTING
Information Patent Grant
System for linearizing a programmable delay circuit
- Patent number 6,330,197
- Issue date Dec 11, 2001
- Credence Systems Corporation
- Jeffrey D. Currin
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for measuring intervals between signal edges
- Patent number 6,246,737
- Issue date Jun 12, 2001
- Credence Systems Corporation
- Philip Theodore Kuglin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Instruction processing pattern generator controlling an integrated...
- Patent number 6,154,865
- Issue date Nov 28, 2000
- Credence Systems Corporation
- Algirdas Joseph Gruodis
- G01 - MEASURING TESTING
Information Patent Grant
Algorithmic pattern generator for integrated circuit tester
- Patent number 6,092,225
- Issue date Jul 18, 2000
- Credence Systems Corporation
- Algirdas Joseph Gruodis
- G01 - MEASURING TESTING
Information Patent Grant
Algorithmic pattern generator
- Patent number 6,009,546
- Issue date Dec 28, 1999
- Credence Systems Corporation
- Philip Theodore Kuglin
- G01 - MEASURING TESTING
Information Patent Grant
Single pass doublet mode integrated circuit tester
- Patent number 5,835,506
- Issue date Nov 10, 1998
- Credence Systems Corporation
- Philip T. Kuglin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for controlling timing of signal pulses
- Patent number 5,789,958
- Issue date Aug 4, 1998
- Credence Systems Corporation
- Douglas J. Chapman
- G06 - COMPUTING CALCULATING COUNTING

Philip T. Kuglin

Person

Patents Grantslast 30 patents

Triggered integrated circuit tester

System for linearizing a programmable delay circuit

Apparatus for measuring intervals between signal edges

Instruction processing pattern generator controlling an integrated...

Algorithmic pattern generator for integrated circuit tester

Algorithmic pattern generator

Single pass doublet mode integrated circuit tester

Apparatus for controlling timing of signal pulses