Philip W. Mason

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Allentown, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Predictive applications for devices with thin dielectric regions
- Patent number 7,230,812
- Issue date Jun 12, 2007
- Agere Systems Inc.
- Muhammad Ashraful Alam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
On-chip apparatus and method for determining integrated circuit str...
- Publication number 20060267621
- Publication date Nov 30, 2006
- Edward B. Harris
- G01 - MEASURING TESTING
Information Patent Application
Predictive applications for devices with thin dielectric regions
- Publication number 20050111155
- Publication date May 26, 2005
- Muhammad Ashraful Alam
- G01 - MEASURING TESTING