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Philip W. Morrison Jr.
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South Windsor, CT, US
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last 30 patents
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Patent Grant
Method and apparatus for monitoring layer processing
Patent number
5,403,433
Issue date
Apr 4, 1995
On-Line Technologies, Inc.
Philip W. Morrison
G01 - MEASURING TESTING
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Patent Grant
Apparatus and method for determining high temperature surface emiss...
Patent number
5,239,488
Issue date
Aug 24, 1993
On-Line Technologies, Inc.
James R. Markham
G01 - MEASURING TESTING
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Patent Grant
Device for blocking of divergent radiation, as in spectroscopy and...
Patent number
5,170,223
Issue date
Dec 8, 1992
Advanced Fuel Research, Inc.
Robert M. Carangelo
G02 - OPTICS
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Patent Grant
Method and apparatus for temperature determination
Patent number
4,985,858
Issue date
Jan 15, 1991
Advanced Fuel Research, Inc.
Philip W. Morrison
G01 - MEASURING TESTING