Philip William Seitzer

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Bethlehem, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of electrical testing of an integrated circuit with an elect...
- Patent number 7,239,160
- Issue date Jul 3, 2007
- Agere Systems Inc.
- James Golden
- G01 - MEASURING TESTING
Information Patent Grant
Method of electrical testing
- Patent number 7,132,840
- Issue date Nov 7, 2006
- Agere Systems Inc.
- James Golden
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of electrical testing
- Publication number 20070024303
- Publication date Feb 1, 2007
- James Golden
- G01 - MEASURING TESTING
Information Patent Application
Method of electrical testing
- Publication number 20060022689
- Publication date Feb 2, 2006
- James Golden
- G01 - MEASURING TESTING