Philipp Huethwohl

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Ulm, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method of recording an image using a particle microscope
- Patent number 11,728,130
- Issue date Aug 15, 2023
- Carl Zeiss SMT GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-scanning electron microscopy for wafer alignment
- Patent number 10,901,391
- Issue date Jan 26, 2021
- Carl Zeiss SMT GmbH
- Jagdish Chandra Saraswatula
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
3D VOLUME INSPECTION METHOD AND METHOD OF CONFIGURING OF A 3D VOLUM...
- Publication number 20240281952
- Publication date Aug 22, 2024
- Carl Zeiss SMT GMBH
- Thomas Korb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION FOR SEMICONDUCTOR STRUCTURES ON A WAFER
- Publication number 20230260105
- Publication date Aug 17, 2023
- Carl Zeiss SMT GMBH
- Thomas Korb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERACTIVE AND ITERATIVE TRAINING OF A CLASSIFICATION ALGORITHM FO...
- Publication number 20220044949
- Publication date Feb 10, 2022
- Carl Zeiss SMT GMBH
- Thomas Korb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF RECORDING AN IMAGE USING A PARTICLE MICROSCOPE
- Publication number 20210296089
- Publication date Sep 23, 2021
- Carl Zeiss SMT GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER INSPECTION METHODS AND SYSTEMS
- Publication number 20210073976
- Publication date Mar 11, 2021
- Carl Zeiss SMT GMBH
- Jagdish Chandra Saraswatula
- G06 - COMPUTING CALCULATING COUNTING