Philippe Garre

Follow

Person

Tempe, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Microelectromechanical systems device test system and method
- Patent number 10,288,447
- Issue date May 14, 2019
- NXP USA, INC.
- Philippe Garre
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROELECTROMECHANICAL SYSTEMS DEVICE TEST SYSTEM AND METHOD
- Publication number 20180120126
- Publication date May 3, 2018
- FREESCALE SEMICONDUCTOR, INC.
- Philippe Garre
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, TEST CHAMBER, AND METHOD FOR RESPONSE TIME MEASUREMENT OF A...
- Publication number 20180058970
- Publication date Mar 1, 2018
- FREESCALE SEMICONDUCTOR, INC.
- Philippe Garre
- G01 - MEASURING TESTING