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Philippe Gastaldo
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Pontcharre, FR
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Patents Grants
last 30 patents
Information
Patent Grant
Method for measuring film thickness distribution of wafer with thin...
Patent number
11,965,730
Issue date
Apr 23, 2024
Shin-Etsu Handotai Co., Ltd.
Susumu Kuwabara
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for inspecting boards for microelectronics or opt...
Patent number
11,092,644
Issue date
Aug 17, 2021
UNITY SEMICONDUCTOR
Philippe Gastaldo
G01 - MEASURING TESTING
Information
Patent Grant
Device for testing a concentrated photovoltaic module
Patent number
11,005,418
Issue date
May 11, 2021
Saint-Augustin Canada Electric Inc.
Philippe Gastaldo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for testing a concentrated photovoltaic module
Patent number
10,432,140
Issue date
Oct 1, 2019
Saint-Augustin Canada Electric Inc.
Remi Blanchard
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Interferometric method and system using variable fringe spacing for...
Patent number
10,260,868
Issue date
Apr 16, 2019
UNITY SEMICONDUCTOR
Mayeul Durand De Gevigney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for 2D/3D inspection of an object such as a wafer
Patent number
10,240,977
Issue date
Mar 26, 2019
UNITY SEMICONDUCTOR
Gilles Fresquet
G01 - MEASURING TESTING
Information
Patent Grant
Integrated chromatic confocal sensor
Patent number
10,082,425
Issue date
Sep 25, 2018
UNITY SEMICONDUCTOR
Philippe Gastaldo
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for inspecting wafers for electronics, optics or...
Patent number
9,857,313
Issue date
Jan 2, 2018
UNITY SEMICONDUCTOR
Mayeul Durand De Gevigney
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for testing a concentrated photovoltaic module
Patent number
9,859,842
Issue date
Jan 2, 2018
Saint-Augustin Canada Electric Inc.
Philippe Gastaldo
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Device and method for inspecting semiconductor materials
Patent number
9,816,942
Issue date
Nov 14, 2017
Altatech Semiconductor
Philippe Gastaldo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Chromatic confocal device and method for 2D/3D inspection of an obj...
Patent number
9,739,600
Issue date
Aug 22, 2017
UNITY SEMICONDUCTOR
Gilles Fresquet
G01 - MEASURING TESTING
Information
Patent Grant
Chromatic confocal device and method for 2D/3D inspection of an obj...
Patent number
9,494,529
Issue date
Nov 15, 2016
FOGALE NANOTECH
Gilles Fresquet
G01 - MEASURING TESTING
Information
Patent Grant
Dark-field semiconductor wafer inspection device
Patent number
9,389,189
Issue date
Jul 12, 2016
Altatech Semiconductor
Philippe Gastaldo
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for inspecting semiconductor wafers
Patent number
9,007,456
Issue date
Apr 14, 2015
Altatech Semiconductor
Philippe Gastaldo
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for inspecting moving semiconductor wafers
Patent number
8,817,249
Issue date
Aug 26, 2014
Alatech Semiconductor
Philippe Gastaldo
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for inspecting semiconductor wafers
Patent number
8,654,324
Issue date
Feb 18, 2014
Altatech Semiconductor
Philippe Gastaldo
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting surface defects on a substrate and device usin...
Patent number
7,812,942
Issue date
Oct 12, 2010
S.O.I. Tec Silicon on Insulator Technologies
Cécile Moulin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR MEASURING FILM THICKNESS DISTRIBUTION OF WAFER WITH THIN...
Publication number
20220341728
Publication date
Oct 27, 2022
Shin-Etsu Handotai Co., Ltd.
Susumu KUWABARA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING BOARDS FOR MICROELECTRONICS OR OPT...
Publication number
20200271718
Publication date
Aug 27, 2020
Unity Semiconductor
Philippe GASTALDO
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING TRANSPARENT WAFERS FOR ELECTRONICS...
Publication number
20180231370
Publication date
Aug 16, 2018
Unity Semiconductor
Mayeul DURAND DE GEVIGNEY
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR 2D/3D INSPECTION OF AN OBJECT SUCH AS A WAFER
Publication number
20170276615
Publication date
Sep 28, 2017
FOGALE NANOTECH
Gilles FRESQUET
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CHROMATIC CONFOCAL SENSOR
Publication number
20170276544
Publication date
Sep 28, 2017
FOGALE NANOTECH
Philippe GASTALDO
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING WAFERS FOR ELECTRONICS, OPTICS OR...
Publication number
20170219496
Publication date
Aug 3, 2017
UNITY SEMICONDUCTOR
Mayeul DURAND DE GEVIGNEY
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR TESTING A CONCENTRATED PHOTOVOLTAIC MODULE
Publication number
20160365834
Publication date
Dec 15, 2016
SOITEC SOLAR GMBH
Philippe Gastaldo
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
DEVICE AND METHOD FOR TESTING A CONCENTRATED PHOTOVOLTAIC MODULE
Publication number
20160352287
Publication date
Dec 1, 2016
SOITEC SOLAR GMBH
Philippe Gastaldo
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
METHOD FOR TESTING A CONCENTRATED PHOTOVOLTAIC MODULE
Publication number
20160344340
Publication date
Nov 24, 2016
SOITEC SOLAR GMBH
Remi Blanchard
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
DEVICE AND METHOD FOR INSPECTING SEMI-CONDUCTOR MATERIALS
Publication number
20140285797
Publication date
Sep 25, 2014
Philippe Gastaldo
G01 - MEASURING TESTING
Information
Patent Application
DARK-FIELD SEMICONDUCTOR WAFER INSPECTION DEVICE
Publication number
20140268121
Publication date
Sep 18, 2014
Philippe Gastaldo
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR INSPECTING MOVING SEMICONDUTOR WAFERS
Publication number
20130044316
Publication date
Feb 21, 2013
ALATECH SEMICONDUCTOR
Philippe Gastaldo
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR INSPECTING SEMICONDUCTOR WAFERS
Publication number
20120057155
Publication date
Mar 8, 2012
Philippe Gastaldo
G02 - OPTICS
Information
Patent Application
DEVICE AND METHOD FOR INSPECTING SEMICONDUCTOR WAFERS
Publication number
20110128371
Publication date
Jun 2, 2011
Philippe Gastaldo
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR INSPECTING SEMI-CONDUCTOR WAFERS
Publication number
20090195786
Publication date
Aug 6, 2009
Philippe Gastaldo
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING SURFACE DEFECTS ON A SUBSTRATE AND DEVICE USIN...
Publication number
20090051930
Publication date
Feb 26, 2009
S. O. I. Tec Silicon on Insulator Technologies
Cecile Moulin
G01 - MEASURING TESTING