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Philippe Lebourg
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Saint Paul de Varces, FR
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Patents Grants
last 30 patents
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Patent Grant
Digital circuit testable through two pins
Patent number
8,928,340
Issue date
Jan 6, 2015
STMicroelectronics S.A.
Philippe Lebourg
G01 - MEASURING TESTING
Information
Patent Grant
Non-volatile read-only memory modifiable by redefinition of a metal...
Patent number
6,879,506
Issue date
Apr 12, 2005
STMicroelectronics S.A.
Philippe Lebourg
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
DIGITAL CIRCUIT TESTABLE THROUGH TWO PINS
Publication number
20120161802
Publication date
Jun 28, 2012
STMicroelectronics (Grenoble 2) SAS
Philippe Lebourg
G01 - MEASURING TESTING
Information
Patent Application
Non-volatile read-only memory modifiable by redefinition of a metal...
Publication number
20030214863
Publication date
Nov 20, 2003
Philippe Lebourg
G11 - INFORMATION STORAGE