Philippe Leray

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La Hulpe, BE

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Patents Grantslast 30 patents

Information Patent Grant
Methods for detecting defects of a lithographic pattern
- Patent number 10,732,124
- Issue date Aug 4, 2020
- Imec VZW
- Sandip Halder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for verifying a pattern of features printed by a lithography...
- Patent number 10,061,209
- Issue date Aug 28, 2018
- Imec VZW
- Julien Mailfert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting a pattern of features on a semiconductor die
- Patent number 9,983,154
- Issue date May 29, 2018
- Imec VZW
- Sandip Halder
- G01 - MEASURING TESTING
Information Patent Grant
Method for hotspot detection and ranking of a lithographic mask
- Patent number 9,874,821
- Issue date Jan 23, 2018
- Imec VZW
- Sandip Halder
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Methods for Detecting Defects of a Lithographic Pattern
- Publication number 20190079023
- Publication date Mar 14, 2019
- IMEC vzw
- Sandip Halder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Inspecting a Pattern of Features on a Semiconductor Die
- Publication number 20170167992
- Publication date Jun 15, 2017
- IMEC vzw
- Sandip Halder
- G01 - MEASURING TESTING
Information Patent Application
Method for Verifying a Pattern of Features Printed by a Lithography...
- Publication number 20170052452
- Publication date Feb 23, 2017
- IMEC vzw
- Julien Mailfert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Hotspot Detection and Ranking of a Lithographic Mask
- Publication number 20160313647
- Publication date Oct 27, 2016
- IMEC vzw
- Sandip Halder
- G01 - MEASURING TESTING