Philippe Perdu

Person

Toulouse, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,439,730
- Issue date Oct 21, 2008
- DCG Systems, Inc.
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic-field-measuring device
- Patent number 7,417,424
- Issue date Aug 26, 2008
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic-field-measuring probe
- Patent number 7,411,391
- Issue date Aug 12, 2008
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring a component of current based on magnetic fields
- Patent number 7,408,342
- Issue date Aug 5, 2008
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,400,154
- Issue date Jul 15, 2008
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,323,862
- Issue date Jan 29, 2008
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Method for customizing an integrated circuit element
- Patent number 7,190,822
- Issue date Mar 13, 2007
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,038,442
- Issue date May 2, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Spatial and temporal selective laser assisted fault localization
- Patent number 6,967,491
- Issue date Nov 22, 2005
- Credence Systems Corporation
- Philippe Perdu
- G01 - MEASURING TESTING
Information Patent Grant
Method and installation for fast fault localization in an integrate...
- Patent number 6,948,107
- Issue date Sep 20, 2005
- Centre National d'Etudes Spatiales (C.N.E.S.)
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 6,943,572
- Issue date Sep 13, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 6,891,363
- Issue date May 10, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Method for comparing recorded pixel images representing equipotenti...
- Patent number 6,816,614
- Issue date Nov 9, 2004
- Centre National d'Etudes Spatiales
- Romain Desplats
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR RECONSTRUCTING A USEFUL SIGNAL FROM A NOISY A...
- Publication number 20180336162
- Publication date Nov 22, 2018
- CENTRE NATIONAL D'ETUDES SPATIALES
- Anthony BOSCARO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of characterizing an electrical defect affecting an electron...
- Publication number 20120116734
- Publication date May 10, 2012
- Centre National D'Etudes Spatiales
- Fulvio INFANTE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MACHINE FOR MULTIDIMENSIONAL TESTING OF AN ELECTRONIC DE...
- Publication number 20110187352
- Publication date Aug 4, 2011
- CENTRE NATIONAL D'ETUDES SPATIALES (C.N.E.S.)
- Philippe Perdu
- G01 - MEASURING TESTING
Information Patent Application
Magnetic-field-measuring probe
- Publication number 20070132464
- Publication date Jun 14, 2007
- Centre National D'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Magnetic-field-measuring probe
- Publication number 20070108975
- Publication date May 17, 2007
- CENTRE NATIONALE D' ETUDES
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Magnetic-field-measuring device
- Publication number 20070052412
- Publication date Mar 8, 2007
- Centre National D'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS
- Publication number 20060181268
- Publication date Aug 17, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20060108997
- Publication date May 25, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20050231219
- Publication date Oct 20, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20050146321
- Publication date Jul 7, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Methods of using measured time resolved photon emission data and si...
- Publication number 20050024057
- Publication date Feb 3, 2005
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Spatial and temporal selective laser assisted fault localization
- Publication number 20050006602
- Publication date Jan 13, 2005
- Philippe Perdu
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20040189335
- Publication date Sep 30, 2004
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20040041575
- Publication date Mar 4, 2004
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Method for customizing an integrated circuit element
- Publication number 20030174171
- Publication date Sep 18, 2003
- Romain Desplats
- G01 - MEASURING TESTING

Philippe Perdu

Person

Patents Grantslast 30 patents

Apparatus and method for detecting photon emissions from transistors

Magnetic-field-measuring device

Magnetic-field-measuring probe

Device for measuring a component of current based on magnetic fields

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

Method for customizing an integrated circuit element

Apparatus and method for detecting photon emissions from transistors

Spatial and temporal selective laser assisted fault localization

Method and installation for fast fault localization in an integrate...

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

Method for comparing recorded pixel images representing equipotenti...

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR RECONSTRUCTING A USEFUL SIGNAL FROM A NOISY A...

Method of characterizing an electrical defect affecting an electron...

METHOD AND MACHINE FOR MULTIDIMENSIONAL TESTING OF AN ELECTRONIC DE...

Magnetic-field-measuring probe

Magnetic-field-measuring probe

Magnetic-field-measuring device

APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

Methods of using measured time resolved photon emission data and si...

Spatial and temporal selective laser assisted fault localization

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

Method for customizing an integrated circuit element