Philippe Planelle

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La Tronche, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for transporting electronic modules
- Patent number 8,448,332
- Issue date May 28, 2013
- STMicroelectronics (Grenoble 2) SAS
- Philippe Planelle
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor component and device and method for connecting such a...
- Patent number 7,422,441
- Issue date Sep 9, 2008
- STMicroelectronics S.A.
- Philippe Planelle
- G01 - MEASURING TESTING
Information Patent Grant
Method for the calibration of an RF integrated circuit probe
- Patent number 6,480,013
- Issue date Nov 12, 2002
- STMicroelectronics, S.A.
- Peter Nayler
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a test circuit on a silicon wafer
- Patent number 6,146,908
- Issue date Nov 14, 2000
- STMicroelectronics, S.A.
- Thierry Falque
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR TRANSPORTING ELECTRONIC MODULES
- Publication number 20100325870
- Publication date Dec 30, 2010
- STMicroelectronics (Grenoble) SAS
- Philippe Planelle
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR COMPONENT AND DEVICE AND METHOD FOR CONNECTING SUCH A...
- Publication number 20070298651
- Publication date Dec 27, 2007
- STMicroelectronics S.A.
- Philippe Planelle
- G01 - MEASURING TESTING