PHILIPPE SOLEIL

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AUREVILLE, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method of converting high-level test specification language to low-...
- Patent number 10,539,609
- Issue date Jan 21, 2020
- NXP USA, INC.
- Arthur Freitas
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING OF SEMICONDUCTOR DEVICES
- Publication number 20160161544
- Publication date Jun 9, 2016
- FREESCALE SEMICONDUCTOR, INC.
- ARTHUR FREITAS
- G01 - MEASURING TESTING