Phillip Lawrence Jones

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dielectric extension to mitigate short channel effects
- Patent number 9,318,333
- Issue date Apr 19, 2016
- Cypress Semiconductor Corporation
- Vidyut Gopal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned patterning method by using non-conformal film and etch...
- Patent number 8,035,153
- Issue date Oct 11, 2011
- Spansion LLC
- Shenqing Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of a polymer spacer and Si trench in a bitline junction of a fl...
- Patent number 7,906,807
- Issue date Mar 15, 2011
- Spansion LLC
- Ning Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of a polymer spacer and Si trench in a bitline junction of a fl...
- Patent number 7,776,688
- Issue date Aug 17, 2010
- Spansion LLC
- Ning Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned patterning method by using non-conformal film and etch...
- Patent number 7,732,276
- Issue date Jun 8, 2010
- Spansion LLC
- Shenqing Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced etching of a high dielectric constant layer
- Patent number 7,498,222
- Issue date Mar 3, 2009
- Advanced Micro Devices, Inc.
- John C. Foster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation region bird's beak suppression
- Patent number 7,465,644
- Issue date Dec 16, 2008
- Advanced Micro Devices, Inc.
- Simon S. Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch process for CD reduction of arc material
- Patent number 7,361,588
- Issue date Apr 22, 2008
- Advanced Micro Devices, Inc.
- Phillip L. Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polymer spacers for creating sub-lithographic spaces
- Patent number 7,285,499
- Issue date Oct 23, 2007
- Advanced Micro Devices, Inc.
- Scott A. Bell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for reducing charging during plasma processing
- Patent number 5,904,571
- Issue date May 18, 1999
- Lam Research Corp.
- Roger Patrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for detecting pattern dependent charging on a...
- Patent number 5,869,877
- Issue date Feb 9, 1999
- Lam Research Corporation
- Roger Patrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic feedback electrostatic wafer chuck
- Patent number 5,812,361
- Issue date Sep 22, 1998
- Lam Research Corporation
- Phillip Lawrence Jones
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methods of Forming a Replacement Gate Electrode With a Reentrant Pr...
- Publication number 20130178055
- Publication date Jul 11, 2013
- GLOBALFOUNDRIES INC.
- Andre P. LaBonte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USE OF A POLYMER SPACER AND SI TRENCH IN A BITLINE JUNCTION OF A FL...
- Publication number 20100264480
- Publication date Oct 21, 2010
- SPANSION LLC
- Ning Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-ALIGNED PATTERNING METHOD BY USING NON-CONFORMAL FILM AND ETCH...
- Publication number 20100230743
- Publication date Sep 16, 2010
- Shenqing Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USE OF A POLYMER SPACER AND SI TRENCH IN A BITLINE JUNCTION OF A FL...
- Publication number 20090042378
- Publication date Feb 12, 2009
- SPANSION LLC
- Ning Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dielectric extension to mitigate short channel effects
- Publication number 20080157199
- Publication date Jul 3, 2008
- Spansion LLC
- Vidyut Gopal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Etch process for CD reduction of arc material
- Publication number 20060223305
- Publication date Oct 5, 2006
- Advanced Micro Devices, Inc.
- Phillip L. Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR IMPROVING ETCH UNIFORMITY AND METHODS THEREFOR
- Publication number 20010049196
- Publication date Dec 6, 2001
- ROGER PATRICK
- H01 - BASIC ELECTRIC ELEMENTS

Phillip Lawrence Jones

Person

Patents Grantslast 30 patents

Dielectric extension to mitigate short channel effects

Self-aligned patterning method by using non-conformal film and etch...

Use of a polymer spacer and Si trench in a bitline junction of a fl...

Use of a polymer spacer and Si trench in a bitline junction of a fl...

Self-aligned patterning method by using non-conformal film and etch...

Enhanced etching of a high dielectric constant layer

Isolation region bird's beak suppression

Etch process for CD reduction of arc material

Polymer spacers for creating sub-lithographic spaces

Methods and apparatus for reducing charging during plasma processing

Methods and apparatus for detecting pattern dependent charging on a...

Dynamic feedback electrostatic wafer chuck

Patents Applicationslast 30 patents

Methods of Forming a Replacement Gate Electrode With a Reentrant Pr...

USE OF A POLYMER SPACER AND SI TRENCH IN A BITLINE JUNCTION OF A FL...

SELF-ALIGNED PATTERNING METHOD BY USING NON-CONFORMAL FILM AND ETCH...

USE OF A POLYMER SPACER AND SI TRENCH IN A BITLINE JUNCTION OF A FL...

Dielectric extension to mitigate short channel effects

Etch process for CD reduction of arc material

APPARATUS FOR IMPROVING ETCH UNIFORMITY AND METHODS THEREFOR