Phillip Marcus Blitz

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Farmers Branch, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
High voltage integrated circuit testing interface assembly
- Patent number 11,624,778
- Issue date Apr 11, 2023
- Texas Instruments Incorporated
- Andrew Patrick Couch
- G01 - MEASURING TESTING
Information Patent Grant
Force biased spring probe pin assembly
- Patent number 10,126,329
- Issue date Nov 13, 2018
- Texas Instruments Incorporated
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Force biased spring probe pin assembly
- Patent number 10,114,038
- Issue date Oct 30, 2018
- Texas Instruments Incorporated
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Force biased spring probe pin assembly
- Patent number 9,755,344
- Issue date Sep 5, 2017
- Texas Instruments Incorporated
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Force biased spring probe pin assembly
- Patent number 9,698,513
- Issue date Jul 4, 2017
- Texas Instruments Incorporated
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH VOLTAGE INTEGRATED CIRCUIT TESTING INTERFACE ASSEMBLY
- Publication number 20210231729
- Publication date Jul 29, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Ming-Chuan You
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE INTEGRATED CIRCUIT TESTING INTERFACE ASSEMBLY
- Publication number 20200300909
- Publication date Sep 24, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Patrick Couch
- G01 - MEASURING TESTING
Information Patent Application
FORCE BIASED SPRING PROBE PIN ASSEMBLY
- Publication number 20170184633
- Publication date Jun 29, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Kay Chan Tong
- G01 - MEASURING TESTING
Information Patent Application
FORCE BIASED SPRING PROBE PIN ASSEMBLY
- Publication number 20170187136
- Publication date Jun 29, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORCE BIASED SPRING PROBE PIN ASSEMBLY
- Publication number 20170187137
- Publication date Jun 29, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORCE BIASED SPRING PROBE PIN ASSEMBLY
- Publication number 20170184632
- Publication date Jun 29, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Kay Chan Tong
- G01 - MEASURING TESTING