Phillip Walsh

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Vacuum ultraviolet absorption spectroscopy system and method
- Patent number 10,641,749
- Issue date May 5, 2020
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum ultraviolet absorption spectroscopy system and method
- Patent number 10,338,040
- Issue date Jul 2, 2019
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Grant
Method for detailed and bulk classification analysis of complex sam...
- Patent number 10,302,607
- Issue date May 28, 2019
- VUV Analytics, Inc.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum ultraviolet absorption spectroscopy system and method
- Patent number 9,976,996
- Issue date May 22, 2018
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum ultraviolet absorption spectroscopy system and method
- Patent number 9,891,197
- Issue date Feb 13, 2018
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum ultraviolet absorption spectroscopy system and method
- Patent number 9,696,286
- Issue date Jul 4, 2017
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum ultraviolet absorption spectroscopy system and method
- Patent number 9,465,015
- Issue date Oct 11, 2016
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for vacuum ultraviolet (VUV) or shorter wavel...
- Patent number 9,310,292
- Issue date Apr 12, 2016
- VUV Analytics, Inc.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum ultraviolet absorption spectroscopy system and method
- Patent number 9,116,158
- Issue date Aug 25, 2015
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Grant
Optical vacuum ultra-violet wavelength nanoimprint metrology
- Patent number 8,867,041
- Issue date Oct 21, 2014
- Jordan Valley Semiconductor Ltd
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for vacuum ultraviolet (VUV) or shorter wavel...
- Patent number 8,773,662
- Issue date Jul 8, 2014
- VUV Analytics, Inc.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for using reflectometry below deep ultra-violet (...
- Patent number 8,564,780
- Issue date Oct 22, 2013
- Jordan Valley Semiconductors Ltd.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Automated calibration methodology for VUV metrology system
- Patent number 8,153,987
- Issue date Apr 10, 2012
- Jordan Valley Semiconductors Ltd.
- Jeffrey B. Hurst
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optically measuring periodic structures us...
- Patent number 7,990,549
- Issue date Aug 2, 2011
- Jordan Valley Semiconductors Ltd.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for using multiple relative reflectance measur...
- Patent number 7,948,631
- Issue date May 24, 2011
- Jordan Valley Semiconductors Ltd.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for accurate calibration of a reflectometer by...
- Patent number 7,663,097
- Issue date Feb 16, 2010
- MetroSol, Inc.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for accurate calibration of a reflectometer by...
- Patent number 7,511,265
- Issue date Mar 31, 2009
- MetroSol, Inc.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for accurate calibration of a reflectometer by...
- Patent number 7,282,703
- Issue date Oct 16, 2007
- MetroSol, Inc.
- Phillip Walsh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Vacuum Ultraviolet Absorption Spectroscopy System And Method
- Publication number 20190293614
- Publication date Sep 26, 2019
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Application
Vacuum Ultraviolet Absorption Spectroscopy System And Method
- Publication number 20170030828
- Publication date Feb 2, 2017
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Application
Vacuum Ultraviolet Absorption Spectroscopy System And Method
- Publication number 20170030874
- Publication date Feb 2, 2017
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Application
Vacuum Ultraviolet Absorption Spectroscopy System And Method
- Publication number 20160377531
- Publication date Dec 29, 2016
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Application
Vacuum Ultraviolet Absorption Spectroscopy System And Method
- Publication number 20160377581
- Publication date Dec 29, 2016
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Application
Method For Detailed And Bulk Classification Analysis Of Complex Sam...
- Publication number 20160363569
- Publication date Dec 15, 2016
- VUV Analytics, Inc.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Vacuum Ultraviolet Absorption Spectroscopy System And Method
- Publication number 20150059440
- Publication date Mar 5, 2015
- VUV Analytics, Inc.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Application
Methods And Apparatus For Vacuum Ultraviolet (VUV) Or Shorter Wavel...
- Publication number 20140264053
- Publication date Sep 18, 2014
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Vacuum Ultraviolet Absorption Spectroscopy System And Method
- Publication number 20140192343
- Publication date Jul 10, 2014
- VUV ANALYTICS, INC.
- Dale A. Harrison
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR VACUUM ULTRAVIOLET (VUV) OR SHORTER WAVEL...
- Publication number 20120268740
- Publication date Oct 25, 2012
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Optical Vacuum Ultra-Violet Wavelength Nanoimprint Metrology
- Publication number 20120182542
- Publication date Jul 19, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for providing multiple wavelength reflectance...
- Publication number 20120170021
- Publication date Jul 5, 2012
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Automated calibration methodology for VUV metrology system
- Publication number 20100294922
- Publication date Nov 25, 2010
- JEFFREY B. HURST
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Using Reflectometry Below Deep Ultra-Violet (...
- Publication number 20100290033
- Publication date Nov 18, 2010
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
COMBINED OPTICAL METROLOGY TECHNIQUES
- Publication number 20100277741
- Publication date Nov 4, 2010
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for optically measuring periodic structures us...
- Publication number 20100177324
- Publication date Jul 15, 2010
- MetroSol, Inc.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for using multiple relative reflectance measur...
- Publication number 20100171959
- Publication date Jul 8, 2010
- MetroSol, Inc.
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for using multiple relative reflectance measur...
- Publication number 20090219537
- Publication date Sep 3, 2009
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Method and system for using reflectometry below deep ultra-violet (...
- Publication number 20080246951
- Publication date Oct 9, 2008
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for optically measuring periodic structures us...
- Publication number 20080129986
- Publication date Jun 5, 2008
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for accurate calibration of a reflectometer by...
- Publication number 20070215801
- Publication date Sep 20, 2007
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for accurate calibration of a reflectometer by...
- Publication number 20070181795
- Publication date Aug 9, 2007
- Phillip Walsh
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for accurate calibration of a reflectometer by...
- Publication number 20070181794
- Publication date Aug 9, 2007
- Phillip Walsh
- G01 - MEASURING TESTING

Phillip Walsh

Person

Patents Grantslast 30 patents

Vacuum ultraviolet absorption spectroscopy system and method

Vacuum ultraviolet absorption spectroscopy system and method

Method for detailed and bulk classification analysis of complex sam...

Vacuum ultraviolet absorption spectroscopy system and method

Vacuum ultraviolet absorption spectroscopy system and method

Vacuum ultraviolet absorption spectroscopy system and method

Vacuum ultraviolet absorption spectroscopy system and method

Methods and apparatus for vacuum ultraviolet (VUV) or shorter wavel...

Vacuum ultraviolet absorption spectroscopy system and method

Optical vacuum ultra-violet wavelength nanoimprint metrology

Methods and apparatus for vacuum ultraviolet (VUV) or shorter wavel...

Method and system for using reflectometry below deep ultra-violet (...

Automated calibration methodology for VUV metrology system

Method and apparatus for optically measuring periodic structures us...

Method and apparatus for using multiple relative reflectance measur...

Method and apparatus for accurate calibration of a reflectometer by...

Method and apparatus for accurate calibration of a reflectometer by...

Method and apparatus for accurate calibration of a reflectometer by...

Patents Applicationslast 30 patents

Vacuum Ultraviolet Absorption Spectroscopy System And Method

Vacuum Ultraviolet Absorption Spectroscopy System And Method

Vacuum Ultraviolet Absorption Spectroscopy System And Method

Vacuum Ultraviolet Absorption Spectroscopy System And Method

Vacuum Ultraviolet Absorption Spectroscopy System And Method

Method For Detailed And Bulk Classification Analysis Of Complex Sam...

Vacuum Ultraviolet Absorption Spectroscopy System And Method

Methods And Apparatus For Vacuum Ultraviolet (VUV) Or Shorter Wavel...

Vacuum Ultraviolet Absorption Spectroscopy System And Method

METHODS AND APPARATUS FOR VACUUM ULTRAVIOLET (VUV) OR SHORTER WAVEL...

Optical Vacuum Ultra-Violet Wavelength Nanoimprint Metrology

Method and apparatus for providing multiple wavelength reflectance...

Automated calibration methodology for VUV metrology system

Method and System for Using Reflectometry Below Deep Ultra-Violet (...

COMBINED OPTICAL METROLOGY TECHNIQUES

Method and apparatus for optically measuring periodic structures us...

Method and apparatus for using multiple relative reflectance measur...

Method and apparatus for using multiple relative reflectance measur...

Method and system for using reflectometry below deep ultra-violet (...

Method and apparatus for optically measuring periodic structures us...

Method and apparatus for accurate calibration of a reflectometer by...

Method and apparatus for accurate calibration of a reflectometer by...

Method and apparatus for accurate calibration of a reflectometer by...