Philo B. Hodge

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Roxbury, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Interposer for maintaining temporary contact between a substrate an...
- Patent number 6,281,692
- Issue date Aug 28, 2001
- International Business Machines Corporation
- Paul F. Bodenweber
- G01 - MEASURING TESTING
Information Patent Grant
Homogeneous screening nozzle
- Patent number 6,045,615
- Issue date Apr 4, 2000
- International Business Machines Corporation
- Alvin W. Buechele
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Contactor and probe assembly for electrical test apparatus
- Patent number 4,816,754
- Issue date Mar 28, 1989
- International Business Machines Corporation
- Alvin W. Buechele
- G01 - MEASURING TESTING
Information Patent Grant
Buckling beam twist probe contactor assembly with spring biased str...
- Patent number 4,518,910
- Issue date May 21, 1985
- International Business Machines Corporation
- Hans G. Hottenrott
- G01 - MEASURING TESTING
Information Patent Grant
Sensing probe for determining location of conductive features
- Patent number 4,227,149
- Issue date Oct 7, 1980
- International Business Machines Corporation
- Louis H. Faure
- G01 - MEASURING TESTING