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Phong T. Tran
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Poughkeepsie, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
High power device fault localization via die surface contouring
Patent number
11,940,271
Issue date
Mar 26, 2024
International Business Machines Corporation
David J. Lewison
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Built-in device testing of integrated circuits
Patent number
10,768,230
Issue date
Sep 8, 2020
International Business Machines Corporation
Robert M. Casatuta
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Iterative N-detect based logic diagnostic technique
Patent number
10,254,336
Issue date
Apr 9, 2019
International Business Machines Corporation
Mary P. Kusko
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic fault model generation for diagnostics simulation and patte...
Patent number
10,169,510
Issue date
Jan 1, 2019
International Business Machines Corporation
Mary P. Kusko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Iterative N-detect based logic diagnostic technique
Patent number
10,024,910
Issue date
Jul 17, 2018
International Business Machines Corporation
Mary P. Kusko
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic fault model generation for diagnostics simulation and patte...
Patent number
9,852,245
Issue date
Dec 26, 2017
International Business Machines Corporation
Mary P. Kusko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dynamic fault model generation for diagnostics simulation and patte...
Patent number
9,552,449
Issue date
Jan 24, 2017
International Business Machines Corporation
Mary P. Kusko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Implementing diagnosis of transitional scan chain defects using log...
Patent number
8,086,924
Issue date
Dec 27, 2011
International Business Machines Corporation
Donato Orazio Forlenza
G01 - MEASURING TESTING
Information
Patent Grant
Implementing isolation of VLSI scan chain using ABIST test patterns
Patent number
8,065,575
Issue date
Nov 22, 2011
International Business Machines Corporation
Donato Orazio Forlenza
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for performing logic built-in self-testing of...
Patent number
7,934,134
Issue date
Apr 26, 2011
International Business Machines Corporation
Donato O. Forlenza
G01 - MEASURING TESTING
Information
Patent Grant
AC ABIST diagnostic method, apparatus and program product
Patent number
7,930,601
Issue date
Apr 19, 2011
International Business Machines Corporation
Joseph Eckelman
G11 - INFORMATION STORAGE
Information
Patent Grant
Verification of array built-in self-test (ABIST) design-for-test/de...
Patent number
7,921,346
Issue date
Apr 5, 2011
International Business Machines Corporation
Donato Orazio Forlenza
G11 - INFORMATION STORAGE
Information
Patent Grant
Automated system and processing for expedient diagnosis of broken s...
Patent number
7,908,532
Issue date
Mar 15, 2011
International Business Machines Corporation
Joseph Eckelman
G01 - MEASURING TESTING
Information
Patent Grant
Diagnosable general purpose test registers scan chain design
Patent number
7,908,534
Issue date
Mar 15, 2011
International Business Machines Corporation
Franco Motika
G01 - MEASURING TESTING
Information
Patent Grant
Method for enhancing the diagnostic accuracy of a VLSI chip
Patent number
7,831,863
Issue date
Nov 9, 2010
International Business Machines Corporation
Mary P. Kusko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
implementing deterministic based broken scan chain diagnostics
Patent number
7,475,308
Issue date
Jan 6, 2009
International Business Machines Corporation
Adrian C. Anderson
G01 - MEASURING TESTING
Information
Patent Grant
Method, apparatus, and computer program product for diagnosing a sc...
Patent number
7,395,470
Issue date
Jul 1, 2008
International Business Machines Corporation
Todd M. Burdine
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for implementing deterministic based broken scan chain diagn...
Patent number
7,395,469
Issue date
Jul 1, 2008
International Business Machines Corporation
Adrian C. Anderson
G01 - MEASURING TESTING
Information
Patent Grant
Method, apparatus, and computer program product for diagnosing a sc...
Patent number
7,392,449
Issue date
Jun 24, 2008
International Business Machines Corporation
Todd M. Burdine
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Diagnostic method for structural scan chain designs
Patent number
6,961,886
Issue date
Nov 1, 2005
International Business Machines Corporation
Franco Motika
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HIGH POWER DEVICE FAULT LOCALIZATION VIA DIE SURFACE CONTOURING
Publication number
20220155049
Publication date
May 19, 2022
International Business Machines Corporation
David J. Lewison
G01 - MEASURING TESTING
Information
Patent Application
ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE
Publication number
20180252769
Publication date
Sep 6, 2018
International Business Machines Corporation
Mary P. Kusko
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTE...
Publication number
20180075170
Publication date
Mar 15, 2018
International Business Machines Corporation
Mary P. Kusko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BUILT-IN DEVICE TESTING OF INTEGRATED CIRCUITS
Publication number
20170343601
Publication date
Nov 30, 2017
International Business Machines Corporation
Robert M. Casatuta
G01 - MEASURING TESTING
Information
Patent Application
ITERATIVE N-DETECT BASED LOGIC DIAGNOSTIC TECHNIQUE
Publication number
20170219651
Publication date
Aug 3, 2017
International Business Machines Corporation
Mary P. Kusko
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTE...
Publication number
20170199946
Publication date
Jul 13, 2017
International Business Machines Corporation
Mary P. Kusko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
VERIFICATION OF ARRAY BUILT-IN SELF-TEST (ABIST) DESIGN-FOR-TEST/DE...
Publication number
20100115337
Publication date
May 6, 2010
Donato Orazio Forlenza
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Implementing Diagnosis of Transitional Scan Chain Defects Using LBI...
Publication number
20100095177
Publication date
Apr 15, 2010
International Business Machines Corporation
Donato Orazio Forlenza
G01 - MEASURING TESTING
Information
Patent Application
Implementing Isolation of VLSI Scan Chain Using ABIST Test Patterns
Publication number
20100095169
Publication date
Apr 15, 2010
International Business Machines Corporation
Donato Orazio Forlenza
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR PERFORMING LOGIC BUILT-IN SELF-TESTING OF...
Publication number
20090307548
Publication date
Dec 10, 2009
Donato O. Forlenza
G01 - MEASURING TESTING
Information
Patent Application
DIAGNOSABLE GENERAL PURPOSE TEST REGISTERS SCAN CHAIN DESIGN
Publication number
20090217116
Publication date
Aug 27, 2009
International Business Machines Corporation
Franco Motika
G01 - MEASURING TESTING
Information
Patent Application
AC ABIST Diagnostic Method, Apparatus and Program Product
Publication number
20090217112
Publication date
Aug 27, 2009
International Business Machines Corporation
Joseph Eckelman
G11 - INFORMATION STORAGE
Information
Patent Application
AC Scan Diagnostic Method and Apparatus Utilizing Functional Archit...
Publication number
20090210761
Publication date
Aug 20, 2009
Donato O. Forlenza
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Automated System and Processing for Expedient Diagnosis of Broken S...
Publication number
20090210763
Publication date
Aug 20, 2009
International Business Machines Corporation
Joseph Eckelman
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING DETERMINIS...
Publication number
20080189583
Publication date
Aug 7, 2008
International Business Machines Corporation
Adrian C. Anderson
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ENHANCING THE DIAGNOSTIC ACCURACY OF A VLSI CHIP
Publication number
20080172576
Publication date
Jul 17, 2008
International Business Machines Corporation
Mary P. Kusko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ITERATIVE TEST GENERATION AND DIAGNOSTIC METHOD BASED ON MODELED AN...
Publication number
20080115029
Publication date
May 15, 2008
International Business Machines Corporation
Mary P. Kusko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR DIAGNOSING A SC...
Publication number
20080091999
Publication date
Apr 17, 2008
International Business Machines Corporation
Todd M. BURDINE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method, apparatus, and computer program product for diagnosing a sc...
Publication number
20070011523
Publication date
Jan 11, 2007
International Business Machines Corporation
Todd M. Burdine
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method, apparatus, and computer program product for implementing de...
Publication number
20050229057
Publication date
Oct 13, 2005
International Business Machines Corporation
Adrian C. Anderson
G01 - MEASURING TESTING
Information
Patent Application
DIAGNOSTIC METHOD FOR STRUCTURAL SCAN CHAIN DESIGNS
Publication number
20040210808
Publication date
Oct 21, 2004
International Business Machines Corporation
Franco Motika
G01 - MEASURING TESTING