Phuc Van

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Non contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,804,294
- Issue date Sep 28, 2010
- Abhee 1, L.P.
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Non contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,741,833
- Issue date Jun 22, 2010
- Ahbee 1, L.P.
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Non contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,737,680
- Issue date Jun 15, 2010
- Ahbee 1, L.P.
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Non contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,737,681
- Issue date Jun 15, 2010
- Ahbee 1, L.P.
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Temperature insensitive low coherence based optical metrology for n...
- Patent number 7,502,121
- Issue date Mar 10, 2009
- Ahbee 1, L.P.
- Wojciech Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Non contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,362,088
- Issue date Apr 22, 2008
- Ahbee 1, L.P.
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Determining thickness of slabs of materials by inventors
- Patent number 7,116,429
- Issue date Oct 3, 2006
- Wojciech J. Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,019,513
- Issue date Mar 28, 2006
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Determination of minority carrier diffusion length in solid state m...
- Patent number 6,922,067
- Issue date Jul 26, 2005
- Ahbee 2, L.P.
- Phuc Van
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for adhesion testing of thin film materials
- Patent number 6,643,393
- Issue date Nov 4, 2003
- Phuc Van
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for adhesion testing of thin film materials
- Patent number 6,611,616
- Issue date Aug 26, 2003
- Phuc Van
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for adhesion testing of thin film materials
- Patent number 6,567,541
- Issue date May 20, 2003
- Ahbee 1, L.P.
- Phuc Van
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for multifunction vacuum/nonvacuum annealing s...
- Patent number 6,546,820
- Issue date Apr 15, 2003
- Phuc Van
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Non contact method and apparatus for measurement of sheet resistanc...

Non contact method and apparatus for measurement of sheet resistanc...

Non contact method and apparatus for measurement of sheet resistanc...

Non contact method and apparatus for measurement of sheet resistanc...

Temperature insensitive low coherence based optical metrology for n...

Non contact method and apparatus for measurement of sheet resistanc...

Determining thickness of slabs of materials by inventors

Non-contact method and apparatus for measurement of sheet resistanc...

Determination of minority carrier diffusion length in solid state m...

Method and apparatus for adhesion testing of thin film materials

Method and apparatus for adhesion testing of thin film materials

Method and apparatus for adhesion testing of thin film materials

Method and apparatus for multifunction vacuum/nonvacuum annealing s...