Pierre Gauje

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Evecquemont, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring transverse thickness profile of...
- Patent number 5,202,909
- Issue date Apr 13, 1993
- Institute de Recherches de la Siderurgie Francaise (IRSID)
- Pierre Gauje
- G01 - MEASURING TESTING