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Pierre Hicks
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Mountain View, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
LiDAR system with optical circulator
Patent number
12,066,536
Issue date
Aug 20, 2024
Aeva, Inc.
Gautam Prabhakar
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for adjusting a beam pattern in a LIDAR system
Patent number
12,055,636
Issue date
Aug 6, 2024
Aeva, Inc.
Cameron Howard
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for FMCW LiDAR system descan compensation
Patent number
11,977,187
Issue date
May 7, 2024
Aeva, Inc.
Keith Gagne
G01 - MEASURING TESTING
Information
Patent Grant
Use of conjugate focal plane to generate target information in a LI...
Patent number
11,768,280
Issue date
Sep 26, 2023
Aeva, Inc.
Keith Gagne
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for beam pattern adjustments in a LIDAR system
Patent number
11,675,085
Issue date
Jun 13, 2023
Aeva, Inc.
Cameron Howard
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for descan compensation in a FMCW LiDAR system
Patent number
11,536,813
Issue date
Dec 27, 2022
AEVA, INC.
Keith Gagne
G01 - MEASURING TESTING
Information
Patent Grant
Coherent LiDAR system utilizing a non-reciprocal optical element
Patent number
11,047,983
Issue date
Jun 29, 2021
Aeva, Inc.
Gautam Prabhakar
G01 - MEASURING TESTING
Information
Patent Grant
Coherent LiDAR system utilizing polarization-diverse architecture
Patent number
10,948,598
Issue date
Mar 16, 2021
Aeva, Inc.
Gautam Prabhakar
G01 - MEASURING TESTING
Information
Patent Grant
Coaxial local oscillator generation at a conjugate focal plane in a...
Patent number
10,908,267
Issue date
Feb 2, 2021
Aeva, Inc.
Keith Gagne
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TECHNIQUES FOR FMCW LIDAR SYSTEM DESCAN COMPENSATION
Publication number
20240288560
Publication date
Aug 29, 2024
Aeva, Inc.
Keith Gagne
G01 - MEASURING TESTING
Information
Patent Application
TECHNIQUES FOR ADJUSTING A BEAM PATTERN IN A LIDAR SYSTEM
Publication number
20240142626
Publication date
May 2, 2024
Aeva, Inc.
Cameron Howard
G01 - MEASURING TESTING
Information
Patent Application
TECHNIQUES FOR FMCW LIDAR SYSTEM DESCAN COMPENSATION
Publication number
20230408655
Publication date
Dec 21, 2023
Aeva, Inc.
Keith Gagne
G01 - MEASURING TESTING
Information
Patent Application
LIDAR SYSTEM WITH OPTICAL CIRCULATOR
Publication number
20220163669
Publication date
May 26, 2022
Aeva, Inc.
Gautam Prabhakar
G01 - MEASURING TESTING
Information
Patent Application
USE OF CONJUGATE FOCAL PLANE TO GENERATE TARGET INFORMATION IN A LI...
Publication number
20220091242
Publication date
Mar 24, 2022
Aeva, Inc.
Keith Gagne
G01 - MEASURING TESTING