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Pierre Leroux
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Laguna Hills, CA, US
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Patents Grants
last 30 patents
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Patent Grant
3d surface scanning white light axial chromatism device
Patent number
10,274,312
Issue date
Apr 30, 2019
Nanovea, Inc.
Pierre Leroux
G02 - OPTICS
Information
Patent Grant
Material testing apparatus with non-contact sensor
Patent number
8,281,648
Issue date
Oct 9, 2012
Nanovea, Inc.
Pierre Leroux
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
3d Surface Scanning White Light Axial Chromatism Device
Publication number
20180364031
Publication date
Dec 20, 2018
Nanovea, Inc.
Pierre Leroux
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR AUTOMATED PARAMETER AND SELECTION TESTING BASED ON KNOWN...
Publication number
20160334315
Publication date
Nov 17, 2016
Nanovea, Inc.
Pierre Leroux
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALCULATING AN INDENTER AREA FUNCTION AND QUANTIFYING A...
Publication number
20160282249
Publication date
Sep 29, 2016
Nanovea, Inc.
Pierre Leroux
G01 - MEASURING TESTING
Information
Patent Application
HIGH SPEED NANO WEAR TESTING APPARATUS
Publication number
20140298897
Publication date
Oct 9, 2014
Nanovea, Inc.
Pierre Leroux
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL TESTING APPARATUS WITH NON-CONTACT SENSOR
Publication number
20090158826
Publication date
Jun 25, 2009
Micro Photonics, Inc.
Pierre Leroux
G01 - MEASURING TESTING