Pierre Panine

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La Terrasse, FR

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Patents Grantslast 30 patents

Information Patent Grant
Compact X-ray analysis system
- Patent number 9,121,812
- Issue date Sep 1, 2015
- Xenocs
- Pierre Panine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD
- Publication number 20240248050
- Publication date Jul 25, 2024
- XENOCS SAS
- Peter HOGHOJ
- G01 - MEASURING TESTING
Information Patent Application
COMPACT X-RAY ANALYSIS SYSTEM
- Publication number 20120294426
- Publication date Nov 22, 2012
- Xenocs
- Pierre Panine
- G01 - MEASURING TESTING