Pierre Sudraud

Person

Puyloubier, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Column simultaneously focusing a particle beam and an optical beam
- Patent number 7,573,050
- Issue date Aug 11, 2009
- DCG Systems, Inc.
- Gérard Benas-Sayag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Column simultaneously focusing a particle beam and an optical beam
- Patent number 7,297,948
- Issue date Nov 20, 2007
- Credence Systems Corporation
- Gerard Benas-Sayag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Column simultaneously focusing a partilce beam and an optical beam
- Patent number 7,045,791
- Issue date May 16, 2006
- Credence Systems Corporation
- Gérard Benas-Sayag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,365,898
- Issue date Apr 2, 2002
- LEO Electron Microscopy Limited
- Pierre Sudraud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High brightness point ion sources using liquid ionic compounds
- Patent number 6,337,540
- Issue date Jan 8, 2002
- International Business Machines Corporation
- Antoine Corbin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heated tool positioned in the X,Y, and 2-directions for depositing...
- Patent number 5,973,295
- Issue date Oct 26, 1999
- International Business Machines Corporation
- Antoine Corbin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for depositing metal fine lines on a substrate
- Patent number 5,741,557
- Issue date Apr 21, 1998
- International Business Machines Corporation
- Antoine Corbin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
IONIC EMISSION MICRONIC SOURCE
- Publication number 20100181493
- Publication date Jul 22, 2010
- Pierre Sudraud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLUMN SIMULTANEOUSLY FOCUSING A PARTICLE BEAM AND AN OPTICAL BEAM
- Publication number 20080111084
- Publication date May 15, 2008
- Gerard Benas-Sayag
- G02 - OPTICS
Information Patent Application
Column simultaneously focusing a particle beam and an optical beam
- Publication number 20060097198
- Publication date May 11, 2006
- Gerard Benas-Sayag
- G02 - OPTICS
Information Patent Application
Column simultaneously focusing a particle beam and an optical beam
- Publication number 20030102436
- Publication date Jun 5, 2003
- Gerard Benas-Sayag
- G02 - OPTICS

Pierre Sudraud

Person

Patents Grantslast 30 patents

Column simultaneously focusing a particle beam and an optical beam

Column simultaneously focusing a particle beam and an optical beam

Column simultaneously focusing a partilce beam and an optical beam

Scanning electron microscope

High brightness point ion sources using liquid ionic compounds

Heated tool positioned in the X,Y, and 2-directions for depositing...

Method for depositing metal fine lines on a substrate

Patents Applicationslast 30 patents

IONIC EMISSION MICRONIC SOURCE

COLUMN SIMULTANEOUSLY FOCUSING A PARTICLE BEAM AND AN OPTICAL BEAM

Column simultaneously focusing a particle beam and an optical beam

Column simultaneously focusing a particle beam and an optical beam