Pierre-Yves Guittet

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring a surface profile of a sample
- Patent number 7,405,089
- Issue date Jul 29, 2008
- Infineon Technologies AG
- Harald Bloess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Noninvasive method for characterizing and identifying embedded micr...
- Patent number 7,262,837
- Issue date Aug 28, 2007
- Infineon Technologies AG
- Pierre-Yves Guittet
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Method for determining or inspecting a property of a patterned layer
- Publication number 20050118735
- Publication date Jun 2, 2005
- Ulrich Mantz
- G01 - MEASURING TESTING
Information Patent Application
Noninvasive method for characterizing and identifying embedded micr...
- Publication number 20050018171
- Publication date Jan 27, 2005
- Pierre-Yves Guittet
- B81 - MICRO-STRUCTURAL TECHNOLOGY