Pieter KRUIT

Person

Delft, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-beam charged particle source with alignment means
- Patent number 12,224,152
- Issue date Feb 11, 2025
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam deflection device, aberration corrector, monochromator, and ch...
- Patent number 12,062,519
- Issue date Aug 13, 2024
- HITACHI HIGH-TECH CORPORATION
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device for inspection of a specimen with a pl...
- Patent number 11,961,709
- Issue date Apr 16, 2024
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithography system, sensor and measuring method
- Patent number RE49602
- Issue date Aug 8, 2023
- ASML Netherlands B.V.
- Pieter Kruit
Information Patent Grant
Lithography system, method of clamping and wafer table
- Patent number RE49488
- Issue date Apr 11, 2023
- ASML Netherlands B.V.
- Guido De Boer
Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,903,042
- Issue date Jan 26, 2021
- TECHNISCHE UNIVERSITEIT DELFT
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithography system, sensor and measuring method
- Patent number RE48046
- Issue date Jun 9, 2020
- ASML Netherlands B.V.
- Pieter Kruit
Information Patent Grant
Aberration correcting device for an electron microscope and an elec...
- Patent number 10,679,819
- Issue date Jun 9, 2020
- HITACHI HIGH-TECH CORPORATION
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting a sample using an assembly comprising a scann...
- Patent number 10,651,009
- Issue date May 12, 2020
- DELMIC IP B.V.
- Jacob Pieter Hoogenboom
- G02 - OPTICS
Information Patent Grant
Signal separator for a multi-beam charged particle inspection appar...
- Patent number 10,504,687
- Issue date Dec 10, 2019
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,453,649
- Issue date Oct 22, 2019
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting a specimen and charged particle multi-beam de...
- Patent number 10,453,645
- Issue date Oct 22, 2019
- Applied Materials Israel Ltd.
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a surface of a sample, using a...
- Patent number 10,395,887
- Issue date Aug 27, 2019
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi electron beam inspection apparatus
- Patent number 10,312,052
- Issue date Jun 4, 2019
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining a density of fluorescent marke...
- Patent number 10,132,753
- Issue date Nov 20, 2018
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting a specimen and charged particle multi-beam de...
- Patent number 9,922,796
- Issue date Mar 20, 2018
- Applied Materials Israel Ltd.
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated optical and charged particle inspection apparatus
- Patent number 9,715,992
- Issue date Jul 25, 2017
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a surface of a sample
- Patent number 9,697,985
- Issue date Jul 4, 2017
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithography system, method of clamping and wafer table
- Patent number 9,665,013
- Issue date May 30, 2017
- Mapper Lithography IP B.V.
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithography system, method of clamping and wafer table
- Patent number 9,645,511
- Issue date May 9, 2017
- Mapper Lithography IP B.V.
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Charged particle multi-beam apparatus including a manipulator devic...
- Patent number 9,607,806
- Issue date Mar 28, 2017
- Mapper Lithography IP B.V.
- Aernout Christiaan Zonnevylle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Arrangement for transporting radicals
- Patent number 9,484,187
- Issue date Nov 1, 2016
- Mapper Lithography IP B.V.
- Pieter Kruit
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for inspecting a surface of a sample
- Patent number 9,449,789
- Issue date Sep 20, 2016
- Technische Universiteit Delft
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Grant
Integrated optical and charged particle inspection apparatus
- Patent number 9,378,921
- Issue date Jun 28, 2016
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithography system and method of refracting
- Patent number 9,208,989
- Issue date Dec 8, 2015
- Mapper Lithography IP B.V.
- Alexander Hendrik Vincent Van Veen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangement and method for transporting radicals
- Patent number 9,123,507
- Issue date Sep 1, 2015
- Mapper Lithography IP B.V.
- Pieter Kruit
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Projection lens arrangement
- Patent number 9,105,439
- Issue date Aug 11, 2015
- Mapper Lithography IP B.V.
- Marco Jan Jaco Wieland
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Lithography system and projection method
- Patent number RE45552
- Issue date Jun 9, 2015
- Mapper Lithography IP B.V.
- Pieter Kruit
- 001 -
Information Patent Grant
Inspection apparatus and replaceable door for a vacuum chamber of s...
- Patent number 8,895,921
- Issue date Nov 25, 2014
- Delmic B.V.
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Grant
Reliability in a maskless lithography system
- Patent number 8,890,095
- Issue date Nov 18, 2014
- Mapper Lithography IP B.V.
- Stijn Willem Herman Karel Steenbrink
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE OPTICS, CHARGED PARTICLE BEAM APPARATUS, AND METHO...
- Publication number 20240290571
- Publication date Aug 29, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM COLUMN, CHARGED PARTICLE BEAM CHROMATIC ABERR...
- Publication number 20240222063
- Publication date Jul 4, 2024
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterpüftechnik mbH
- John Breuer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LENS FOR A CHARGED PARTICLE BEAM APPARATUS, CHARGED PARTICLE BEAM A...
- Publication number 20240212968
- Publication date Jun 27, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...
- Publication number 20240170249
- Publication date May 23, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Application
MULTI-BEAM CHARGED PARTICLE SOURCE WITH ALIGHMENT MEANS
- Publication number 20240096585
- Publication date Mar 21, 2024
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20240006149
- Publication date Jan 4, 2024
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR INSPECTING A SPECIMEN AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20220392735
- Publication date Dec 8, 2022
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Beam Deflection Device, Aberration Corrector, Monochromator, and Ch...
- Publication number 20220172920
- Publication date Jun 2, 2022
- Hitachi High-Tech Corporation
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20200273667
- Publication date Aug 27, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for inspecting a sample using a plurality of c...
- Publication number 20200035447
- Publication date Jan 30, 2020
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for inspecting a surface of a sample, using a...
- Publication number 20190259570
- Publication date Aug 22, 2019
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Signal separator for a multi-beam charged particle inspection appar...
- Publication number 20190259564
- Publication date Aug 22, 2019
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aberration Correcting Device for an Electron Microscope and an Elec...
- Publication number 20190228946
- Publication date Jul 25, 2019
- Hitachi High-Technologies Corporation
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR GENERATING CHARGED PARTICLE BEAM PULSES
- Publication number 20190096630
- Publication date Mar 28, 2019
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR INSPECTING A SPECIMEN AND CHARGED PARTICLE MULTI-BEAM DE...
- Publication number 20180158642
- Publication date Jun 7, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI ELECTRON BEAM INSPECTION APPARATUS
- Publication number 20170243717
- Publication date Aug 24, 2017
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for inspecting a sample using an assembly comprising a scann...
- Publication number 20170221675
- Publication date Aug 3, 2017
- DELMIC B.V.
- Jacob Pieter HOOGENBOOM
- G02 - OPTICS
Information Patent Application
Apparatus and method for inspecting a sample using a plurality of c...
- Publication number 20170133198
- Publication date May 11, 2017
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A DENSITY OF FLUORESCENT MARKE...
- Publication number 20160377544
- Publication date Dec 29, 2016
- DELMIC B.V.
- Jacob Pieter HOOGENBOOM
- G01 - MEASURING TESTING
Information Patent Application
Arrangement for transporting radicals
- Publication number 20150332899
- Publication date Nov 19, 2015
- MAPPER LITHOGRAPHY IP BV
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING A SURFACE OF A SAMPLE
- Publication number 20150270095
- Publication date Sep 24, 2015
- Technische Universiteit Delft
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS
- Publication number 20150262784
- Publication date Sep 17, 2015
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for inspecting a surface of a sample
- Publication number 20150179399
- Publication date Jun 25, 2015
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS
- Publication number 20150108350
- Publication date Apr 23, 2015
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Arrangement and method for transporting radicals
- Publication number 20150028223
- Publication date Jan 29, 2015
- MAPPER LITHOGRAPHY IP BV
- Pieter Kruit
- F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information Patent Application
LITHOGRAPHY SYSTEM, METHOD OF CLAMPING AND WAFER TABLE
- Publication number 20140185028
- Publication date Jul 3, 2014
- Guido DE BOER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHY SYSTEM, METHOD OF CLAMPING AND WAFER TABLE
- Publication number 20140176920
- Publication date Jun 26, 2014
- Guido DE BOER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PROJECTION LENS ARRANGEMENT
- Publication number 20140014852
- Publication date Jan 16, 2014
- Marco Jan Jaco WIELAND
- B82 - NANO-TECHNOLOGY
Information Patent Application
INSPECTION APPARATUS AND REPLACEABLE DOOR FOR A VACUUM CHAMBER OF S...
- Publication number 20130200262
- Publication date Aug 8, 2013
- DELMIC B.V.
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE MULTI-BEAMLET APPARATUS
- Publication number 20120305798
- Publication date Dec 6, 2012
- Aernout Christiaan Zonnevylle
- B82 - NANO-TECHNOLOGY

Pieter KRUIT

Person

Patents Grantslast 30 patents

Multi-beam charged particle source with alignment means

Beam deflection device, aberration corrector, monochromator, and ch...

Charged particle beam device for inspection of a specimen with a pl...

Lithography system, sensor and measuring method

Lithography system, method of clamping and wafer table

Apparatus and method for inspecting a sample using a plurality of c...

Lithography system, sensor and measuring method

Aberration correcting device for an electron microscope and an elec...

Method for inspecting a sample using an assembly comprising a scann...

Signal separator for a multi-beam charged particle inspection appar...

Apparatus and method for inspecting a sample using a plurality of c...

Method for inspecting a specimen and charged particle multi-beam de...

Apparatus and method for inspecting a surface of a sample, using a...

Multi electron beam inspection apparatus

Method and apparatus for determining a density of fluorescent marke...

Method for inspecting a specimen and charged particle multi-beam de...

Integrated optical and charged particle inspection apparatus

Apparatus and method for inspecting a surface of a sample

Lithography system, method of clamping and wafer table

Lithography system, method of clamping and wafer table

Charged particle multi-beam apparatus including a manipulator devic...

Arrangement for transporting radicals

Apparatus and method for inspecting a surface of a sample

Integrated optical and charged particle inspection apparatus

Lithography system and method of refracting

Arrangement and method for transporting radicals

Projection lens arrangement

Lithography system and projection method

Inspection apparatus and replaceable door for a vacuum chamber of s...

Reliability in a maskless lithography system

Patents Applicationslast 30 patents

CHARGED PARTICLE OPTICS, CHARGED PARTICLE BEAM APPARATUS, AND METHO...

CHARGED PARTICLE BEAM COLUMN, CHARGED PARTICLE BEAM CHROMATIC ABERR...

LENS FOR A CHARGED PARTICLE BEAM APPARATUS, CHARGED PARTICLE BEAM A...

CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...

MULTI-BEAM CHARGED PARTICLE SOURCE WITH ALIGHMENT MEANS

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

METHOD FOR INSPECTING A SPECIMEN AND CHARGED PARTICLE BEAM DEVICE

Beam Deflection Device, Aberration Corrector, Monochromator, and Ch...

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

Apparatus and method for inspecting a sample using a plurality of c...

Apparatus and method for inspecting a surface of a sample, using a...

Signal separator for a multi-beam charged particle inspection appar...

Aberration Correcting Device for an Electron Microscope and an Elec...

DEVICE AND METHOD FOR GENERATING CHARGED PARTICLE BEAM PULSES

METHOD FOR INSPECTING A SPECIMEN AND CHARGED PARTICLE MULTI-BEAM DE...

MULTI ELECTRON BEAM INSPECTION APPARATUS

Method for inspecting a sample using an assembly comprising a scann...

Apparatus and method for inspecting a sample using a plurality of c...

METHOD AND APPARATUS FOR DETERMINING A DENSITY OF FLUORESCENT MARKE...

Arrangement for transporting radicals

APPARATUS AND METHOD FOR INSPECTING A SURFACE OF A SAMPLE

INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS

Apparatus and method for inspecting a surface of a sample

INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS

Arrangement and method for transporting radicals

LITHOGRAPHY SYSTEM, METHOD OF CLAMPING AND WAFER TABLE

LITHOGRAPHY SYSTEM, METHOD OF CLAMPING AND WAFER TABLE

PROJECTION LENS ARRANGEMENT

INSPECTION APPARATUS AND REPLACEABLE DOOR FOR A VACUUM CHAMBER OF S...

CHARGED PARTICLE MULTI-BEAMLET APPARATUS